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High-frequency measurement system services Material testing Probe station Microwave anechoic chamber/shielded roomLan Cable Fully Automatic Tester Auto Switch fully automatic testing machine USB 4 / Type-C finished product line test system DisplayPort 2.1 finished product line test system HDMI 2.1 finished product line test system MCIO finished product line testing system Gen-Z finished product line testing system PCIE finished product line test system OCuLink Finished Product Line Test System QSFP/SFP finished product line test system HSD finished product line test system FAKRA finished product line testing system SAS/MiniSAS/SlimSAS Finished Product Line Testing System Raw Cable 20G/40G/50G Bare Wire Test System SATA/eSATA finished product line test system LVDS finished product line testing system Pre-test Integration ProjectElectromagnetic shielding test system Material electromagnetic parameter testing system Resistivity testing system Cable Shielding Effectiveness Test System Conductive gasket shielding effectiveness test system Reflection rate test system for absorbing materials NSS Noise Suppression/Absorption Sheet Performance Evaluation System Pre-compatibility testing systemUltra-low temperature vacuum probe station Automated probe station Manual probe station Displacement platform
HSD finished product line test system
Product Description Sainte Gertrude Electronics has designed a quick and simple testing system for Lan Cables. The system includes compliant measurement fixtures and testing software. This system tightly integrates RFC LAN software with a Network Analyzer (NA), enabling quick and accurate measurement of various parameters of Lan Cables. This allows R&D and QA departments to achieve real-time detection/judgment/correction, improving product yield. The GT HF-1200, GT HF-1500, and GT HF-2000 network cable fully automatic testing systems are precision devices suitable for performance testing of high-performance digital cables (CAT 5, CAT 6, CAT 7, CAT 8, etc.).
Category:
High-frequency measurement system services
Product Attachment:
- Product Description
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- Commodity name: HSD finished product line test system
Product Description Sainte Gertrude Electronics has designed a quick and simple testing system for Lan Cables. The system includes compliant measurement fixtures and testing software. This system tightly integrates RFC LAN software with a Network Analyzer (NA), enabling quick and accurate measurement of various parameters of Lan Cables. This allows R&D and QA departments to achieve real-time detection/judgment/correction, improving product yield. The GT HF-1200, GT HF-1500, and GT HF-2000 network cable fully automatic testing systems are precision devices suitable for performance testing of high-performance digital cables (CAT 5, CAT 6, CAT 7, CAT 8, etc.).
FeaturesMatching Test Specifications
Measurement software built-in UL, TIA/EIA and other standard specifications.
■ Excellent System Characteristics
High Accuracy
Multi-channel dual BALUN design
High-frequency matrix design makes the system excellent
Uses imported high-grade high-frequency components
■ Easy to operate, easy-to-learn software, fast and complete report output
Operators can easily get started, with low training costs
Operating system supports various network analyzers
Supports multiple format outputs (*.rpt/*.xls/*.pdf) and Chinese/English report output
Test ParametersHigh-frequency Test Parameters:
1. Attenuation
2. Characteristic impedance (Matched-load method)
3. Characteristic impedance (Open / Short method)
4. Characteristic impedance (Curvefitting method)
5. Return loss
6. Structural return loss
7. Propagation delay
8. Propagation velocity
9. Delay skew
10. Near-end crosstalk
11. Near-end crosstalk power sum
12. Far-end crosstalk
13. Far-end crosstalk power sum
14. Equal level far-end crosstalk
15. Equal level far-end crosstalk power sum
16. ACR - attenuation-to-crosstalk ratio
17. ACR PwrSum - Attenuation-to-crosstalk ratio power sum
18. TCL / ELTCTL Transverse Conversion Loss / Equal Level Transverse Conversion Transmission Loss (Optional)
(BH Balun 040-0092 Mode /650MHz under)
Low-frequency Test Parameters:
1. DCR DC Resistance
2. DCR Unbalance
3. Mutual-Capacitance
4. Capacitance unbalance
Optional Items1. Power Sum Alien Near-End XTalk (PSANEXT)
2. Power Sum Attenuation to Alien Crosstalk Ratio, Far-end (PSAACRF)
Far-end Attenuation to Alien Crosstalk Ratio Power Sum
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Add.: 2nd Floor, Building C, Zhongzhi Zhichuang Park, Yucui Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province, China
Tel: +86-135 1042 6680
Email: harriosn@sengt.com
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