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R&S®ZNB3004 Vector Network Analyzer 9 kHz to 4.5 GHz
Ultra-fast measurement cycles deliver excellent throughput. With frequency ranges of 9 kHz to 4.5 GHz, 9 GHz, 20 GHz, and 26.5 GHz, the R&S®ZNB3000 vector network analyzer is an ideal choice for communications and aerospace applications. The R&S®ZNB3000 excels and delivers optimal results in mass production environments for RF devices and applications with short rise times. The R&S®ZNB3000 features a flexible upgrade concept, allowing it to quickly scale up to meet various requirements. With fast measurement speeds, high stability, excellent RF performance, and multiple expansion functions, the R&S®ZNB3000 is well-suited for its tasks.
Category:
Desktop network analyzer
Product Attachment:
- Product Description
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- Commodity name: R&S®ZNB3004 Vector Network Analyzer 9 kHz to 4.5 GHz
Ultra-fast measurement cycles deliver excellent throughput. With frequency ranges of 9 kHz to 4.5 GHz, 9 GHz, 20 GHz, and 26.5 GHz, the R&S®ZNB3000 vector network analyzer is an ideal choice for communications and aerospace applications. The R&S®ZNB3000 excels and delivers optimal results in mass production environments for RF devices and applications with short rise times. The R&S®ZNB3000 features a flexible upgrade concept, allowing it to quickly scale up to meet various requirements. With fast measurement speeds, high stability, excellent RF performance, and multiple expansion functions, the R&S®ZNB3000 is well-suited for its tasks.
R&S®ZNB3020 Network Analyzer: All-in-one Solution for High-precision RF Testing
I. Product Overview
II. Core Technical Advantages
- Frequency Range : 100kHz to 20GHz, covering high-frequency applications such as 5G communication, satellite navigation, and radar systems
- Dynamic Range : 140dB (typical), capable of clearly capturing weak signals (e.g., -120dBm), suitable for precise characterization of low-loss devices (e.g., filters, antennas)
- Temperature Stability : 0.01dB/°C, ensuring consistency during long-term testing and reducing environmental interference
- built-in intermodulation wizard : Supports odd-order intermodulation product measurements such as third-order and fifth-order, with one-click test report generation
- Four-port Design : Integrates two independent signal sources, eliminating the need for an external combiner, reducing measurement time by 10 times
- Real-time Spectrum Analysis : Simultaneously displays fundamental and intermodulation products, quickly pinpointing non-linear distortion issues
- 12.1-inch Touchscreen : Intuitive graphical interface, supporting drag-and-drop parameter settings
- Virtual Network Embedding : Quickly de-embeds fixture effects, simplifying testing procedures for complex structures (e.g., PCB boards)
- Multi-port Expansion : Expandable to 48 ports via switch matrix, meeting the testing requirements for large-scale MIMO arrays
III. Typical Application Scenarios
- Amplifiers : Power sweep (98dB range) and gain compression testing
- Mixers : Conversion loss, isolation, and harmonic suppression analysis
- Filters : Group delay, in-band ripple, and out-of-band suppression measurements
- 5G Base Stations : PA linearity, antenna array calibration
- Satellite Communication : Performance evaluation of millimeter-wave components (e.g., frequency multipliers, phase shifters)
- IoT Devices : RF consistency testing of NB-IoT modules
- Segmented Scan : Completes 401 points test in 4ms, increasing throughput by 30%_
- Automated Calibration : Completes TSM calibration in 30 seconds, reducing human error
IV. Technical Parameter Comparison
V. User Value and Industry Recognition
- Improve R&D Efficiency : After adopting ZNB3020, a 5G chip manufacturer shortened PA linearity test cycles by 40%_
- Reduce Production Costs : With built-in calibration tools, a filter production line saved over 500,000 RMB in annual calibration costs
- Industry Certifications : Supports standards such as MIL-STD-810H, IEC 61326, suitable for harsh environments like aerospace and military industries
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I. Hardware Options
- Function Compliant with IEEE 370 standard, it supports automatic removal of the test fixture's influence from the Device Under Test (DUT) data, suitable for PCB board-level testing.
- Order Number 1328.8611.02
- Application Scenarios Precise measurement of high-frequency components (such as filters, amplifiers).
- Function Automatic calibration of the test fixture through the fixture database, reducing manual calibration time.
- Order Number 1328.8628.02
- Application Scenarios Scenarios with frequent fixture changes in mass production environments.
- Function Developed in cooperation with the Swiss Federal Office of Metrology (METAS), it automatically calculates the measurement uncertainty range and displays it synchronously with the S-parameters.
- Order Number 3644.5977.02
- Dependencies Requires METAS's "VNA Tool" software.
- Function Expands the power scan range and improves the dynamic range of amplifier measurements.
- Typical Parameters Attenuation range 0-70 dB, applicable to ports 3/4.
- Application Scenarios Required for nonlinear device testing with a wide power range.
- Function Directly controls radio frequency front-end modules (such as switches, attenuators), supporting automated testing.
- Application Scenarios Integration of multi-port devices or complex test systems.
- Function Communicates with other devices via the IEEE 488 protocol, facilitating remote control in production environments.
- Application Scenarios Automated test processes in laboratories or production lines.
- Function Increases output power to +16 dBm (typical), meeting the testing needs of high-power devices.
- Application Scenarios Overload characteristic testing of power amplifiers and filters.
II. Software Options
- Function Supports Distance To Fault (DTF) measurement, filter debugging, and eye diagram analysis.
- Typical Parameters Resolution ≤10 ps, supports time domain gating.
- Application Scenarios Fault location of cables/connectors, high-speed digital signal integrity analysis.
- Function Measures common-mode/differential-mode parameters of balanced devices, supporting differential signal analysis.
- Application Scenarios Characteristic characterization of differential amplifiers, transformers, and high-speed interfaces (such as USB 3.0).
- Function De-embedding based on standard fixtures (such as SOLT, LRRM), eliminating test fixture errors.
- Application Scenarios Wafer-level testing, high-frequency characteristic extraction after chip packaging.
- Function Measures the phase noise and single-sideband noise power of signal sources.
- Typical Parameters Noise floor ≤-165 dBc/Hz (10 kHz offset).
- Application Scenarios Noise performance evaluation of oscillators and phase-locked loops (PLLs).
- Function Supports nonlinear measurements such as compression point, harmonic distortion, and intermodulation distortion (IMD).
- Application Scenarios Nonlinear characteristic testing of power amplifiers and mixers.
- Function Locates impedance discontinuities using time-domain reflection technology, supporting TDR/TDT modes.
- Application Scenarios Impedance consistency detection of PCB traces and cable assemblies.
III. Other Expansion Options
- Function Supports up to 48-port measurements through an external switch matrix, suitable for complex system-level testing.
- Typical Configuration R&S ZN-Z84 switch matrix + automatic calibration unit.
- Application Scenarios Multi-port characteristic analysis of phased array antennas and MIMO systems.
- Function Includes standard components (such as open, short, and load) and calibration algorithms to ensure measurement accuracy.
- Typical Model ：R&S ZN-Z12 (3.5 mm calibration kit), R&S ZN-Z13 (2.4 mm calibration kit).
- Function ：Automated testing is achieved through SCPI commands or LabVIEW drivers.
- Typical Tools ：R&S VISA driver, Keysight IO Libraries Suite.
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