R&S®ZNB3020 Vector Network Analyzer 100 kHz to 20 GHz
Ultra-fast measurement cycles deliver excellent throughput. With frequency ranges of 9 kHz to 4.5 GHz, 9 GHz, 20 GHz, and 26.5 GHz, the R&S®ZNB3000 vector network analyzer is an ideal choice for communications and aerospace applications. The R&S®ZNB3000 excels and delivers optimal results in mass production environments for RF devices and applications with short rise times. The R&S®ZNB3000 features a flexible upgrade concept, allowing it to quickly scale up to meet various requirements. With fast measurement speeds, high stability, excellent RF performance, and multiple expansion functions, the R&S®ZNB3000 is well-suited for its tasks.
Category:
Desktop network analyzer
Product Attachment:
- Product Description
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- Brand: 罗德与施瓦茨
- Commodity name: R&S®ZNB3020 Vector Network Analyzer 100 kHz to 20 GHz
- Brand: Rohde & Schwarz
Ultra-fast measurement cycles deliver excellent throughput. With frequency ranges of 9 kHz to 4.5 GHz, 9 GHz, 20 GHz, and 26.5 GHz, the R&S®ZNB3000 vector network analyzer is an ideal choice for communications and aerospace applications. The R&S®ZNB3000 excels and delivers optimal results in mass production environments for RF devices and applications with short rise times. The R&S®ZNB3000 features a flexible upgrade concept, allowing it to quickly scale up to meet various requirements. With fast measurement speeds, high stability, excellent RF performance, and multiple expansion functions, the R&S®ZNB3000 is well-suited for its tasks.
R&S®ZNB3020 Network Analyzer: A comprehensive solution for high-precision RF testing
I. Product Overview
II. Core Technological Advantages
- Frequency Range :100kHz to 20GHz, covering high-frequency scenarios such as 5G communication, satellite navigation, and radar systems.
- Dynamic Range :140dB (typical value), capable of clearly capturing weak signals (such as -120dBm), suitable for the precise characterization of low-loss devices (such as filters and antennas).
- Temperature Stability :0.01dB/°C, ensuring consistency in long-term testing and reducing the impact of environmental interference.
- built-in intermodulation wizard :Supports the measurement of third-order, fifth-order, and other odd-order intermodulation products, with one-click test report generation.
- Four-Port Design :Integrates two independent signal sources, eliminating the need for an external combiner, reducing measurement time by 10 times.
- Real-time Spectrum Analysis :Simultaneously displays fundamental waves and intermodulation products, quickly locating nonlinear distortion problems.
- 12.1-inch Touch Screen :Intuitive graphical interface, supporting drag-and-drop parameter settings.
- Virtual Network Embedding :Quickly de-embeds fixture effects, simplifying the testing process for complex structures (such as PCBs).
- Multi-port Expansion :Expandable to 48 ports via a switch matrix to meet the testing needs of large-scale MIMO arrays.
III. Typical Application Scenarios
- Amplifiers :Power scan (98dB range) and gain compression testing.
- Mixers :Conversion loss, isolation, and harmonic suppression analysis.
- Filters :Group delay, in-band ripple, and out-of-band suppression measurement.
- 5G Base Stations :PA linearity, antenna array calibration.
- Satellite Communication :Performance evaluation of millimeter-wave components (such as frequency multipliers and phase shifters).
- Internet of Things Devices :RF conformance testing of NB-IoT modules.
- Segmented Scan :Completes 401-point tests within 4ms, increasing throughput by 30%.
- Automated Calibration :Completes TSM calibration in 30 seconds, reducing human error.
IV. Technical Parameter Comparison
V. User Value and Industry Recognition
- Improved R&D Efficiency :After adopting ZNB3020, a 5G chip manufacturer reduced the PA linearity test cycle by 40%.
- Reduced Production Costs :Through built-in calibration tools, a filter production line saved over 500,000 yuan in annual calibration costs.
- Industry Certifications :Supports standards such as MIL-STD-810H and IEC 61326, suitable for harsh environments in aerospace and military applications.
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I. Hardware Options
- Function Compliant with IEEE 370 standard, it supports automatic removal of the test fixture's influence from the Device Under Test (DUT) data, suitable for PCB board-level testing.
- Order Number 1328.8611.02
- Application Scenarios Precise measurement of high-frequency components (such as filters, amplifiers).
- Function Automatic calibration of the test fixture through the fixture database, reducing manual calibration time.
- Order Number 1328.8628.02
- Application Scenarios Scenarios with frequent fixture changes in mass production environments.
- Function Developed in cooperation with the Swiss Federal Office of Metrology (METAS), it automatically calculates the measurement uncertainty range and displays it synchronously with the S-parameters.
- Order Number 3644.5977.02
- Dependencies Requires METAS's "VNA Tool" software.
- Function Expands the power scan range and improves the dynamic range of amplifier measurements.
- Typical Parameters Attenuation range 0-70 dB, applicable to ports 3/4.
- Application Scenarios Required for nonlinear device testing with a wide power range.
- Function Directly controls radio frequency front-end modules (such as switches, attenuators), supporting automated testing.
- Application Scenarios Integration of multi-port devices or complex test systems.
- Function Communicates with other devices via the IEEE 488 protocol, facilitating remote control in production environments.
- Application Scenarios Automated test processes in laboratories or production lines.
- Function Increases output power to +16 dBm (typical), meeting the testing needs of high-power devices.
- Application Scenarios Overload characteristic testing of power amplifiers and filters.
II. Software Options
- Function Supports Distance To Fault (DTF) measurement, filter debugging, and eye diagram analysis.
- Typical Parameters Resolution ≤10 ps, supports time domain gating.
- Application Scenarios Fault location of cables/connectors, high-speed digital signal integrity analysis.
- Function Measures common-mode/differential-mode parameters of balanced devices, supporting differential signal analysis.
- Application Scenarios Characteristic characterization of differential amplifiers, transformers, and high-speed interfaces (such as USB 3.0).
- Function De-embedding based on standard fixtures (such as SOLT, LRRM), eliminating test fixture errors.
- Application Scenarios Wafer-level testing, high-frequency characteristic extraction after chip packaging.
- Function Measures the phase noise and single-sideband noise power of signal sources.
- Typical Parameters Noise floor ≤-165 dBc/Hz (10 kHz offset).
- Application Scenarios Noise performance evaluation of oscillators and phase-locked loops (PLLs).
- Function Supports nonlinear measurements such as compression point, harmonic distortion, and intermodulation distortion (IMD).
- Application Scenarios Nonlinear characteristic testing of power amplifiers and mixers.
- Function Locates impedance discontinuities using time-domain reflection technology, supporting TDR/TDT modes.
- Application Scenarios Impedance consistency detection of PCB traces and cable assemblies.
III. Other Expansion Options
- Function Supports up to 48-port measurements through an external switch matrix, suitable for complex system-level testing.
- Typical Configuration R&S ZN-Z84 switch matrix + automatic calibration unit.
- Application Scenarios Multi-port characteristic analysis of phased array antennas and MIMO systems.
- Function Includes standard components (such as open, short, and load) and calibration algorithms to ensure measurement accuracy.
- Typical Model :R&S ZN-Z12 (3.5 mm calibration kit), R&S ZN-Z13 (2.4 mm calibration kit).
- Function :Automated testing is achieved through SCPI commands or LabVIEW drivers.
- Typical Tools :R&S VISA driver, Keysight IO Libraries Suite.
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