-
High-frequency measurement system services Material testing Probe station Microwave anechoic chamber/shielded roomLan Cable Fully Automatic Tester Auto Switch fully automatic testing machine USB 4 / Type-C finished product line test system DisplayPort 2.1 finished product line test system HDMI 2.1 finished product line test system MCIO finished product line testing system Gen-Z finished product line testing system PCIE finished product line test system OCuLink Finished Product Line Test System QSFP/SFP finished product line test system HSD finished product line test system FAKRA finished product line testing system SAS/MiniSAS/SlimSAS Finished Product Line Testing System Raw Cable 20G/40G/50G Bare Wire Test System SATA/eSATA finished product line test system LVDS finished product line testing system Pre-test Integration ProjectElectromagnetic shielding test system Material electromagnetic parameter testing system Resistivity testing system Cable Shielding Effectiveness Test System Conductive gasket shielding effectiveness test system Reflection rate test system for absorbing materials NSS Noise Suppression/Absorption Sheet Performance Evaluation System Pre-compatibility testing systemUltra-low temperature vacuum probe station Automated probe station Manual probe station Displacement platform
N5235A PNA-L Microwave Network Analyzer, 50 GHz
Category:
Desktop network analyzer
Network analyzer
Product Attachment:
- Product Description
- Selection
-
- Brand: 是德科技
- Commodity name: N5235A PNA-L Microwave Network Analyzer, 50 GHz
- Brand: Keysight Technologies
In-depth Analysis of the Keysight N5235A PNA-L Microwave Network Analyzer
I. Core Technical Parameters and Positioning
II. Typical Application Scenarios and Technical Advantages
- High-Frequency Passive Component Testing ：
- Measurement of out-of-band suppression (>60 dB) and insertion loss (<1.5 dB) of filters below 50 GHz (such as 5G n257/n258 band filters).
- Directionality and polarization characteristic analysis of planar antennas (such as phased array antenna units), supporting near-field testing on a probe station.
- Simple Active Device Evaluation ：
- Testing of small-signal gain (e.g., gain > 18 dB at 30 GHz) and input/output matching (S11/S22<-15 dB) of power amplifiers (PA).
- Measurement of conversion loss (<8 dB) and port isolation (LO-IF isolation > 35 dB) of mixers.
- Material and Interconnect Characterization ：
- Extraction of dielectric constant (Dk=10.2±0.1) and dissipation factor (Df<0.0023) of high-frequency board materials (such as Rogers 6010LM), supporting microstrip/stripline structure testing.
- Measurement of insertion loss (<3 dB/m at 50 GHz) and phase stability (phase drift <5° when temperature cycles ±5℃) of 2.92mm connector cable assemblies.
- Does not natively support frequencies above 50 GHz. Testing automotive radar (76-81 GHz) requires an external millimeter-wave downconverter module (such as Keysight N1426A), but this introduces additional conversion loss (approximately 12 dB) and phase noise (increase of 0.8 dB RMS).
III. Key Points for High-Frequency Testing
- Standard 2.92mm interface (50Ω), compatible with 3.5mm devices (requires adapter, such as 85032F, insertion loss <0.3 dB@40 GHz). Avoid using N-type interfaces (loss increases significantly above 18 GHz, VSWR>1.4).
- Calibration Scheme:
- Within 50 GHz: Use the 125B series 2.92mm precision calibration kits (covering 10 MHz-26.5 GHz), supporting Ecal fast calibration (<50 seconds).
- When using external modules: Perform TRL calibration (using 85052D standard parts) to reduce adapter errors (directional error <0.15 dB).
- It is recommended to test in a constant temperature (23±1℃) environment to avoid the influence of temperature changes on phase measurement (a change of 1℃ causes a 0.08°/GHz phase drift).
- Cable Management: Use a phase-stable cable (such as Keysight 85133E), and perform "cable de-embedding" before each test to eliminate measurement deviations caused by cable bending (amplitude error < 0.08 dB).
- For higher frequencies or automated functions, you can upgrade to N5235B (50 GHz, supports touchscreen and USB control) or N5225B (10 MHz-50 GHz, integrated vector signal analysis function).
- With a limited budget, consider a used N5235A with factory calibration service (calibration cycle is recommended every six months to ensure accuracy meets MIL-STD-45662A).
IV. Discontinued Product Support and Migration Suggestions
- N5235A will cease production in December 2024. Existing inventory will be supported until mid-2025, and repair services will be extended to 2027 (extended warranty required).
- Firmware updates will end in June 2025. It is recommended to upgrade to the latest version (10.20) to support Windows 10 system compatibility.
V. Selection Decision Reference
- Recommended Scenarios ：
- R&D and verification of 5G millimeter-wave components for communication equipment manufacturers (such as power amplifiers, duplexers).
- Wideband circuit design in university microwave laboratories (such as filter optimization, antenna matching), with a moderate budget but requiring coverage of frequencies below 50 GHz.
- High-frequency component spot checks for small and medium-sized production lines (such as annual inspection of less than 50,000 millimeter-wave antennas for VSWR).
- Pitfalls to Avoid ：
- Avoid using it to test devices with power exceeding 0 dBm (may damage the receiver). For high-power scenarios, an external attenuator (such as a 10 dB fixed attenuator) is required.
-
Basic Configuration and Hardware Options
- 200 2-port basic hardware configuration, covering a frequency range of 10 MHz to 50 GHz, including a single built-in signal source and basic S-parameter measurement functions.
- 216 2-port configurable test set, integrated source attenuator, supporting more flexible test scenario adjustments.
- 416 4-port configurable test set and source attenuator (device compatibility needs to be confirmed).
- 1CM Rack mounting kit (without handle), suitable for standard 19-inch rack mounting.
- 1CP Rack mounting kit (with handle), providing more convenient rack mounting and handling functions.
Calibration and Measurement Enhancement Options
- 007 Automatic fixture removal function, supporting quick elimination of system errors introduced by test fixtures.
- 301 Application option used with standard calibration kits (such as 85032D), suitable for general calibration scenarios.
- 302 Application option used with temperature characteristic calibration kits, supporting high-precision calibration of temperature-sensitive devices.
- 551 N-port calibration measurement function, expandable to precise calibration and testing of multi-port devices.
- A6J ANSI Z540-1-1994 standard calibration service, providing calibration certificates that comply with industry standards.
- UK6 Commercial calibration certificate (with test data), meeting the quality control needs of enterprises.
Function Expansion and Advanced Measurement Options
- 010 Time-domain analysis function, supporting time-domain reflectometry (TDR) and filter tuning optimization.
- 015 Dynamic uncertainty analysis, used to evaluate the uncertainty range of S-parameter measurements.
- 080 Frequency offset measurement mode, suitable for nonlinear characteristic testing of devices such as mixers and amplifiers.
- 082 Scalar calibration converter measurement function, simplifying the operation process in scalar network analysis scenarios.
- 083 Vector and scalar calibration converter measurement function, supporting more comprehensive characterization of converter characteristics.
- 084 Embedded local oscillator (LO) measurement function, suitable for testing devices with integrated local oscillator signals.
- 090 Spectrum analyzer function module, enabling integrated testing of spectrum analysis and network analysis.
Software and Automation Options
- 897 Built-in performance test software (permanent license), including comprehensive calibration verification and device diagnostic tools.
- 898 Built-in performance test software (standard-compliant calibration), supporting standardized process calibration and report generation.
- 1A7 Calibration + Uncertainty + Guard Band Analysis function, providing a more rigorous evaluation of measurement results. 。
Other Useful Options
- ECal Module Electronic calibration module (needs to be purchased separately), supporting fast automated calibration, reducing calibration time and complexity. 。
- TRL/LRM Calibration Kit Calibration solution suitable for high-precision fixtures and wafer-level measurements. 。
- Pulse RF Test Kit Supports pulse signal measurement and can analyze the response characteristics of devices under pulse excitation.
Previous Page
Product Consultation
Please fill out the form below, leave your contact information and needs, and we will be happy to serve you!
Contact Information
Add.: 2nd Floor, Building C, Zhongzhi Zhichuang Park, Yucui Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province, China
Tel: +86-135 1042 6680
Email: harriosn@sengt.com
Follow us
Follow us