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N5235B PNA-L Microwave Network Analyzer, 300 kHz to 50 GHz, 2-port (single built-in source).
Category:
Network analyzer
Desktop network analyzer
Product Attachment:
- Product Description
- Selection
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- Brand: 是德科技
- Commodity name: N5235B PNA-L Microwave Network Analyzer, 300 kHz to 50 GHz, 2-port (single built-in source).
- Brand: Keysight Technologies
Main Technical Specifications
- Frequency Range : 10 MHz to 50 GHz (covering C, X, Ku, K, Ka bands, supporting high-frequency applications such as 5G millimeter wave, satellite communication, and automotive radar).
- Dynamic Range : Typical value 123 dB (2-port, 10 kHz IF bandwidth, ensuring high-resolution measurement of low-level signals).
- Output Power : Range from -15 dBm to +10 dBm (supports power calibration, suitable for linear/non-linear characteristic analysis of low-noise amplifiers and power devices).
- Number of Measurement Points : Up to 32,001 measurement points (fine frequency response scanning, capturing details such as filter narrowband characteristics and impedance anomalies).
- IF Bandwidth (IF BW) : 1 Hz to 10 MHz adjustable (narrow bandwidth improves sensitivity, wide bandwidth accelerates mass production test efficiency).
- Port Configuration : 2-port standard configuration (supports expansion to multi-port measurements via external switches, meeting complex network test requirements).
Core Features
- High-Precision S-Parameter Measurement ：
- Supports basic parameters such as amplitude, phase, group delay, VSWR, impedance/admittance, as well as non-linear characteristic analysis like intermodulation distortion (IMD) and gain compression (AM/AM, AM/PM).
- Built-in error correction algorithms reduce the impact of system errors on measurement results (e.g., source match error, directivity error).
- Intelligent Calibration and User Experience ：
- Compatible with Electronic Calibration Kits (ECal), enabling fully automatic calibration within 10 seconds, and supporting rapid calibration in multiple scenarios such as on-chip, module, and antenna.
- 12.1-inch multi-touch display, graphical interface intuitively shows measurement traces, Smith charts, and data lists, supporting gesture zooming and quick parameter configuration.
- Time Domain and Advanced Analysis Functions ：
- Time domain analysis mode: Uses Inverse Fourier Transform (IFT) of frequency domain data to locate transmission line discontinuities (e.g., cable faults, PCB trace defects), supporting gating technology to separate multipath signals.
- Material and Dielectric Characterization: In conjunction with coaxial/waveguide fixtures or free-space test setups, measures high-frequency material properties such as dielectric constant, permeability, and loss tangent.
- Flexible Expansion and Integration Capability ：
- External millimeter-wave frequency extension modules (e.g., 110 GHz band extension) can be connected to meet higher frequency band R&D needs;
- Equipped with USB, LAN, and GPIB interfaces, supporting software programming control (e.g., LabVIEW, MATLAB) for seamless integration into automated test systems.
Typical Application Scenarios
- 5G Millimeter Wave and Satellite Communication ：
- Tests insertion loss, isolation, and out-of-band rejection of millimeter-wave front-end modules (PA/LNA/phase shifters), verifying device performance in the 28 GHz/39 GHz bands.
- Analyzes VSWR and port isolation of phased array antenna elements, assisting with array calibration and beamforming optimization.
- Automotive Radar and Aerospace ：
- Tests 77 GHz/79 GHz automotive radar sensor components (e.g., transceiver modules, microstrip antennas) to ensure target detection accuracy and anti-interference capability.
- Measures loss and phase consistency of high-frequency connectors and filters for aerospace applications, meeting reliability requirements in harsh environments.
- Material and Device R&D ：
- Dielectric characterization of high-frequency PCB substrates (e.g., Rogers, PTFE) to support 5G base station PCB design optimization.
- Wafer-level testing of on-chip RF devices (RFIC), extracting S-parameters with a probe station for circuit modeling and simulation.
- Education and Scientific Research ：
- University lab teaching: Demonstrating RF principles, vector network analyzer operation, and high-frequency circuit analysis methods.
- Research institutions: Supporting electromagnetic characteristic measurement and theoretical verification of novel structures such as metamaterials and tunable devices.
Summary of Advantages
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I. Hardware Configuration Options
- N5235B-200
2-port basic hardware configuration, supporting basic S-parameter measurements, covering the 10 MHz - 50 GHz frequency band, suitable for routine testing of single-port or two-port devices (such as filters, low-noise amplifiers). - N5235B-216
2-port configurable test kit (including source attenuator), supporting dynamic adjustment of test signal power (-50 dBm to +13 dBm), used for analyzing power-related characteristics (such as amplifier compression point, nonlinear device response), including source attenuator calibration file.
II. Calibration and Certification Options
- N5235B-1A7
Calibration + Uncertainty + Guard Band (non-accredited), providing daily calibration services and measurement uncertainty reports, suitable for rapid calibration during the R&D phase or routine accuracy verification on the production line. - N5235B-UK6
Commercial calibration certificate with test data, meeting the compliance requirements of third-party certification and contract acceptance, requires a standard certificate issued by an official calibration laboratory. - N5235B-A6J
ANSI Z540-1-1994 standard calibration, conforming to the strict calibration standards of the American National Standards Institute, suitable for scenarios such as aerospace and defense that have extremely high requirements for calibration processes.
III. Software and Functional Expansion Options
- S93007B
Automatic Fixture Removal (AFLR), supporting wafer-level testing or frequent fixture replacement scenarios, eliminating fixture loss and phase deviation through de-embedding technology, improving the testing efficiency of on-chip devices (such as MMICs, PCB interconnects). - S93010B
Time-domain analysis function, supporting pulse response and group delay measurement, used for time-domain characteristic evaluation of high-speed digital signal transmission lines (such as PCB traces, cable assemblies). - S93011B
Enhanced time-domain analysis (including TDR option), combined with time-domain reflectometry technology, accurately locating impedance mismatch points (such as vias, connector defects), suitable for critical signal integrity scenarios (such as high-speed backplanes, data center interconnects). - S93082B
Scalar mixer/converter measurement, supporting parameter testing such as frequency conversion loss, isolation, and port matching, simplifying the performance analysis of radio frequency front-end modules (such as mixers, frequency converters). - S930905B
Spectrum analysis (up to 50 GHz), real-time observation of signal spectrum distribution, detection of spurious signals, harmonics, and phase noise, suitable for signal quality assessment of high-frequency communication devices (such as 5G millimeter-wave modules, satellite communication components). - S93898B
Built-in performance testing software, providing automatic calibration, instrument status monitoring, and long-term stability verification tools, reducing maintenance costs, suitable for large-scale production or long-term continuous testing environments.
IV. Installation and Storage Options
- N5235B-1CM
Handle-less mobile rack mounting kit, supporting 1U rack integration, saving laboratory or production line space, facilitating multi-device collaborative control (such as with an automated testing platform). - N5235B-1CP
Handle-equipped mobile rack mounting kit, combining rack fixing and portable handling needs, suitable for laboratory scenarios requiring frequent movement or debugging. - SSD (removable solid-state drive)
Expand storage capacity, supporting local storage and quick retrieval of massive test data (such as long-time frequency sweep data, multiple batches of calibration files), recommended for use with high-frequency spectrum analysis or time-domain testing options.
V. Key Matching Suggestions
- Power-related testing : If you need to analyze the linear/nonlinear characteristics of devices at different power levels, it is recommended to select N5235B-216 (source attenuator) + S93082B (mixer measurement) ， accurately control the input power and obtain nonlinear parameters.
- High-frequency signal integrity : For 50 GHz high-speed link testing, combine S93011B (TDR time-domain analysis) + S930905B (full-band spectrum analysis) ， synchronously verify time-domain impedance and frequency-domain signal quality.
- Compliance Calibration : Commercial delivery scenarios prioritize UK6 Calibration Certificate ， while strict industrial environments require A6J Standard Calibration ， daily R&D uses 1A7 Basic Calibration 即可。
- N5235B-200
Product Consultation
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Contact Information
Add.: 2nd Floor, Building C, Zhongzhi Zhichuang Park, Yucui Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province, China
Tel: +86-135 1042 6680
Email: harriosn@sengt.com
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