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E8362C PNA Series Network Analyzer, 10 MHz to 20 GHz

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Network analyzer

Desktop network analyzer


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    • Brand: 是德科技
    • Commodity name: E8362C PNA Series Network Analyzer, 10 MHz to 20 GHz
    • Brand: Keysight Technologies

    High-Performance Vector Network Analyzer E8362B: Precise Measurement, Empowering the RF and Microwave Field

    As a core product of Keysight's PNA series, the E8362B is a vector network analyzer specifically designed for high-frequency, high-performance component testing. With its superior technical specifications and flexible application capabilities, it is widely used in wireless communication, radar systems, and semiconductor research and development, providing engineers with high-precision and high-efficiency testing solutions.

    I. Core Technical Indicators

    Frequency Coverage
    E8362B Basic Model Supports 10 MHz to 20 GHz wideband measurement, meeting the testing needs of most RF components. Through optional expansion modules, the frequency range can be further extended to higher frequency bands (needs to be confirmed based on specific configuration).
    Dynamic Range and Measurement Accuracy
    • 123 dB dynamic range : Achieves industry-leading signal capture capability within the 20 GHz band, clearly distinguishing weak signals from strong interference.
    • <0.006 dB trace noise : Extremely low noise levels ensure the stability and repeatability of measurement results, especially suitable for high-precision R&D scenarios.
    • <26 microseconds/point measurement speed : Supports 32 independent channels, each with up to 16,001 measurement points, significantly improving batch testing efficiency.
    Calibration and Measurement Functions
    • TRL/LRM calibration technology : Supports high-precision calibration in complex scenarios such as on-wafer, in-fixture, waveguide, and antenna, ensuring consistency in different testing environments.
    • Multi-parameter Measurement Capability : Can simultaneously measure key parameters such as mixer conversion loss, return loss, isolation, group delay, and supports amplifier gain compression, intermodulation distortion (IMD), and pulsed RF testing.

    II. Application Fields and Advantages

    Wireless Communication and RF Component Testing
    The E8362B can accurately analyze the S-parameters of components such as filters, amplifiers, and antennas, assisting in the research and development and production of 5G base stations and satellite communication equipment. Its fast scanning capability can significantly shorten product debugging cycles and reduce R&D costs.
    Semiconductor and Material Property Analysis
    In conjunction with TRL/LRM calibration technology, the E8362B can perform high-resolution measurements on wafer-level devices, supporting semiconductor process optimization and characterization of new materials (such as RF chips and microwave dielectrics).
    Radar and Military Electronic Systems
    In radar component testing, the E8362B's wide dynamic range and low noise characteristics can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments.

    III. Design Highlights and User Value

    Modularity and Expandability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research.
    Easy Operation and Data Management
    The intuitive graphical interface combined with automated testing software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Reliability and Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle.

    IV. Typical Configurations and Industry Cases

    • Basic Configuration : 10 MHz to 20 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    • Extended Configuration : Adding pulse test modules or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    • Industry Cases : A university research team used the E8362B to optimize millimeter-wave antenna arrays. Using its high-precision measurement data, they successfully improved antenna gain by 3dB and shortened the R&D cycle by 20%.


     

    With its superior performance, flexible configuration, and wide applicability, the E8362B vector network analyzer has become the preferred tool for RF and microwave engineers. Whether in laboratory R&D or production line testing, its precise data support and efficient testing capabilities create significant value for users.
  • 8362B PNA Series Microwave Vector Network Analyzer List of Options, covering hardware configuration, calibration enhancement, function expansion, and software support:

    Basic Hardware Configuration

    Frequency Range
    • E8362B : 10 MHz to 20 GHz (standard configuration, no official frequency extension option).
    Port Configuration
    • 2-Port Basic Configuration : Standard support for 2-port S-parameter measurement, covering 10 MHz to 20 GHz.
    • 4-Port Expansion : Some materials mention that it can be upgraded to a 4-port test set via options (such as the 146/246 options similar to the N5230C), but compatibility needs to be confirmed with the official. 5

    Calibration and Measurement Enhancement

    Calibration Kit
    • N4691A Calibration Kit : Suitable for calibration in the 10 MHz to 20 GHz frequency band, supporting TRL/LRM calibration technology, compatible with high-precision measurement scenarios such as wafers, fixtures, and waveguides. 7
    • Electronic Calibration (ECal) Module : Needs to be purchased separately, supports fast automated calibration, reducing calibration time and complexity.
    Calibration Function
    • TRL/LRM Calibration Support : Built-in algorithm supports high-precision fixture and wafer-level measurements.
    • Dynamic Uncertainty Analysis : Evaluates the error range of measurement results, improving data reliability (may require software option support).

    Function Expansion and Advanced Measurement

    Nonlinear Measurement
    • Mixer Test : Supports frequency conversion loss, return loss, isolation, and group delay measurement, requires built-in function or specific software option.
    • Amplifier Characteristics : Gain compression, harmonic distortion (IMD), and pulse RF response analysis; some functions may require options (such as the 080 frequency bias mode of the E8363B). 8
    Time Domain Analysis
    • Time Domain Reflectometry (TDR) : Used for filter tuning, fault location, etc., may require an option similar to the E8363B's 010 option, but E8362B compatibility needs to be confirmed. 8
    Spectrum Analysis
    • Integrated Spectrum Analysis Function : Enables integrated network and spectrum testing; some materials do not clearly state whether a separate option is required.

    Software and Automation

    Built-in Test Software
    • Performance Test Software : Includes calibration verification, device diagnostics, and standardized report generation functions; some models require options (such as the E8363B's 897/898).
    • Pulse RF Test Kit : Supports pulse signal measurement, analyzing the response characteristics of devices under pulse excitation; requires option support (such as the E8363B's pulse RF test kit).
    Interface and Control
    • GPIB/USB/LAN Interface : Supports remote control and automated test processes; standard configuration.

    Other Useful Options

    • Rack Mounting Kit
      • 19-inch rack mounting bracket : Suitable for standard rack deployment, improving laboratory integration (specific codes need to be referenced from the official documentation).
    • High-Power Test Configuration
      • H85 Option : Expands the power range, supporting high-power device testing (refer to the E8363B option, E8362B compatibility needs to be verified). 8
    • Bias T-Type Connector
      • UNL Option : Provides DC bias capability, suitable for active device testing (refer to the E8363B option, compatibility needs to be verified).

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