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E8363B PNA Series Network Analyzer, 10 MHz to 40 GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
  • Selection
    • Brand: 是德科技
    • Commodity name: E8363B PNA Series Network Analyzer, 10 MHz to 40 GHz
    • Brand: Keysight Technologies

    High-Performance Vector Network Analyzer E8363B: 40GHz Ultra-Wideband Measurement, Empowering High-Frequency Electronics Innovation

    The E8363B, a core product in Keysight's PNA series, is a vector network analyzer specifically designed for high-frequency, high-precision component testing. It 10 MHz to 40 GHz Its ultra-wide frequency coverage, combined with excellent dynamic range and flexible calibration technology, is widely used in cutting-edge fields such as 5G communication, millimeter-wave radar, and semiconductor research and development, providing engineers with efficient and reliable testing solutions.

    I. Core Technical Indicators

    Ultra-wide Frequency Coverage and High-Precision Measurement
    The E8363B base model supports 10 MHz to 40 GHz wideband measurement, meeting the testing needs of most high-frequency components (such as millimeter-wave antennas and RF chips). Through optional expansion modules, the frequency range can be further extended to higher frequency bands (needs to be confirmed based on specific configuration).
    Industry-Leading Dynamic Range and Stability
    • 110 dB dynamic range : Achieves industry-leading signal acquisition capabilities within the 40 GHz band, clearly distinguishing weak signals from strong interference.
    • <0.006 dB trace noise : Extremely low noise levels ensure the stability and repeatability of measurement results, especially suitable for high-precision R&D scenarios. 7
    • <26 microseconds/point measurement speed : Supports 32 independent channels, each with up to 16,001 measurement points, significantly improving batch testing efficiency.
    Intelligent Calibration and Multi-parameter Analysis Capabilities
    • TRL/LRM calibration technology : Supports high-precision calibration in complex scenarios such as on-wafer, in-fixture, waveguide, and antenna, ensuring consistency in different testing environments.
    • Multi-parameter simultaneous measurement : Can simultaneously measure key parameters such as mixer conversion loss, return loss, isolation, group delay, and supports amplifier gain compression, intermodulation distortion (IMD), and pulsed RF testing.

    II. Application Areas and Advantages

    5G Communication and Millimeter-Wave Technology
    The E8363B can accurately analyze the S-parameters of 5G base station antenna arrays and RF front-end modules. Its wide dynamic range and low-noise characteristics facilitate efficient debugging of millimeter-wave signals (such as 28 GHz and 39 GHz bands), shortening product launch cycles. Typical applications include:
    • Millimeter-wave antenna gain and radiation pattern testing
    • RF chip linearity and power consumption optimization
    • Base station RF module integration testing
    Semiconductor and Materials Research and Development
    In conjunction with TRL/LRM calibration technology, the E8363B can perform high-resolution measurements on wafer-level devices, supporting:
    • Characteristic characterization of RF chips (such as gallium nitride power amplifiers)
    • Dielectric constant testing of new microwave materials (such as high-frequency PCB substrates)
    • Process verification of semiconductor processes (such as lithography and etching)
    Radar and Military Electronic Systems
    In radar component testing, the wide dynamic range and low-noise characteristics of the E8363B can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments:
    • Beamforming and sidelobe suppression testing of radar antennas
    • Amplitude and phase consistency calibration of phased array radar components
    • Assessment of anti-interference capabilities of military electronic equipment

    III. Design Highlights and User Value

    Modularity and Expandability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research. For example:
    • Adding a pulse test module can meet the pulse signal analysis needs of radar systems.
    • Configuring a multi-port expansion module enables rapid testing of multiple-input and multiple-output (MIMO) antenna systems.
    Convenient Operation and Data Management
    The intuitive graphical interface combined with automated testing software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle. For example, software upgrades can add support for the latest communication standards (such as 6G).

    IV. Typical Configurations and Industry Cases

    • Basic Configuration : 10 MHz to 40 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    • Expanded Configuration : Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    • Industry Cases : A university research team used the E8363B to optimize millimeter-wave antenna arrays. Using its high-precision measurement data, they successfully improved antenna gain by 3dB and shortened the R&D cycle by 20%. 6

    V. Replacement Models and Technological Evolution

    The E8363B has been discontinued. Its functions are inherited by E8363C and N52 series PNA-X network analyzers The new generation of products has been upgraded in the following aspects:


     

    • Higher frequency coverage N5244B supports 10 MHz to 67 GHz
    • Stronger nonlinear measurement capabilities Integrated built-in pulse generator and harmonic measurement module
    • Intelligent test process Automated testing and data analysis through PathWave software


     

    The E8363B vector network analyzer, with its superior performance, flexible configuration, and wide applicability, has become a classic tool for engineers in the high-frequency electronics field. Whether in laboratory R&D or production line testing, its precise data support and efficient testing capabilities create significant value for users.
  • Basic Hardware Configuration

    Frequency Range
    • E8363B : 10 MHz to 40 GHz (standard configuration, no official frequency extension option).
    Port Configuration
    • 2-Port Basic Configuration : Standard support for 2-port S-parameter measurement, covering 10 MHz to 40 GHz.
    • 4-Port Expansion : Some materials mention that it can be upgraded to a 4-port test set via an option (such as the 146/246 option similar to the N5230C), but compatibility needs to be confirmed with the official.

    Calibration and Measurement Enhancement

    Calibration Kit
    • HP85052B : 3.5mm calibration kit, supports TRL/LRM calibration technology, suitable for high-precision measurement scenarios such as wafers, fixtures, and waveguides 22
    • HP85056A : 2.4mm calibration kit, compatible with higher-frequency millimeter-wave device testing.
    • Electronic Calibration (ECal) Module : Such as N4691D, supports fast automated calibration, reducing calibration time and complexity.
    Calibration Function
    • TRL/LRM Calibration Support : Built-in algorithm supports high-precision fixture and wafer-level measurements.
    • Dynamic Uncertainty Analysis : Evaluate the error range of the measurement results to improve data reliability (may require software option support).

    Function Expansion and Advanced Measurement

    Nonlinear Measurement
    • Mixer Test : Supports frequency conversion loss, return loss, isolation, and group delay measurement; requires built-in function or specific software option.
    • Amplifier Characteristics : Gain compression, harmonic distortion (IMD), and pulse RF response analysis; some functions require option support, such as:
      • 080 Option : Frequency offset mode, enhances nonlinear measurement accuracy.
      • UNL Option : Expands the power range and provides a bias T-type connector, suitable for active device testing.
    Time Domain Analysis
    • 010 Option : Time Domain Reflectometry (TDR), used for filter tuning, fault location, etc.
    Spectrum Analysis
    • Integrated Spectrum Analysis Function : Enables integrated network and spectrum testing; some materials do not clearly state whether a separate option is required.

    Software and Automation

    Built-in Test Software
    • Pulse RF Test Kit : Supports pulse signal measurement and analyzes the response characteristics of devices under pulse excitation; requires option support.
    • Nonlinear Measurement Software : Such as mixer test algorithms, including vector error correction technology.
    Interface and Control
    • GPIB/USB/LAN Interface : Supports remote control and automated test processes; standard configuration.

    Other Useful Options

    • High-Power Test Configuration
      • H85 Option : Expands the power range to support high-power device testing.
    • Rack Mounting Kit
      • 19-inch rack mounting bracket : Suitable for standard rack deployment to improve laboratory integration (specific codes should refer to the official documentation).

    Notes

    1. Compatibility Verification : Some options (such as 4-port configuration and high-power testing) need to confirm compatibility with the E8363B hardware version and firmware.
    2. Calibration Kit Matching : Calibration kits (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5mm)

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