E8363B PNA Series Network Analyzer, 10 MHz to 40 GHz
Category:
Network analyzer
Desktop network analyzer
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- Brand: 是德科技
- Commodity name: E8363B PNA Series Network Analyzer, 10 MHz to 40 GHz
- Brand: Keysight Technologies
High-Performance Vector Network Analyzer E8363B: 40GHz Ultra-Wideband Measurement, Empowering High-Frequency Electronics Innovation
I. Core Technical Indicators
- 110 dB dynamic range : Achieves industry-leading signal acquisition capabilities within the 40 GHz band, clearly distinguishing weak signals from strong interference.
- <0.006 dB trace noise : Extremely low noise levels ensure the stability and repeatability of measurement results, especially suitable for high-precision R&D scenarios. 。
- <26 microseconds/point measurement speed : Supports 32 independent channels, each with up to 16,001 measurement points, significantly improving batch testing efficiency.
- TRL/LRM calibration technology : Supports high-precision calibration in complex scenarios such as on-wafer, in-fixture, waveguide, and antenna, ensuring consistency in different testing environments.
- Multi-parameter simultaneous measurement : Can simultaneously measure key parameters such as mixer conversion loss, return loss, isolation, group delay, and supports amplifier gain compression, intermodulation distortion (IMD), and pulsed RF testing.
II. Application Areas and Advantages
- Millimeter-wave antenna gain and radiation pattern testing
- RF chip linearity and power consumption optimization
- Base station RF module integration testing
- Characteristic characterization of RF chips (such as gallium nitride power amplifiers)
- Dielectric constant testing of new microwave materials (such as high-frequency PCB substrates)
- Process verification of semiconductor processes (such as lithography and etching)
- Beamforming and sidelobe suppression testing of radar antennas
- Amplitude and phase consistency calibration of phased array radar components
- Assessment of anti-interference capabilities of military electronic equipment
III. Design Highlights and User Value
- Adding a pulse test module can meet the pulse signal analysis needs of radar systems.
- Configuring a multi-port expansion module enables rapid testing of multiple-input and multiple-output (MIMO) antenna systems.
IV. Typical Configurations and Industry Cases
- Basic Configuration : 10 MHz to 40 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
- Expanded Configuration : Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
- Industry Cases : A university research team used the E8363B to optimize millimeter-wave antenna arrays. Using its high-precision measurement data, they successfully improved antenna gain by 3dB and shortened the R&D cycle by 20%. 。
V. Replacement Models and Technological Evolution
- Higher frequency coverage N5244B supports 10 MHz to 67 GHz
- Stronger nonlinear measurement capabilities Integrated built-in pulse generator and harmonic measurement module
- Intelligent test process Automated testing and data analysis through PathWave software
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Basic Hardware Configuration
- E8363B : 10 MHz to 40 GHz (standard configuration, no official frequency extension option).
- 2-Port Basic Configuration : Standard support for 2-port S-parameter measurement, covering 10 MHz to 40 GHz.
- 4-Port Expansion : Some materials mention that it can be upgraded to a 4-port test set via an option (such as the 146/246 option similar to the N5230C), but compatibility needs to be confirmed with the official.
Calibration and Measurement Enhancement
- HP85052B : 3.5mm calibration kit, supports TRL/LRM calibration technology, suitable for high-precision measurement scenarios such as wafers, fixtures, and waveguides 。
- HP85056A : 2.4mm calibration kit, compatible with higher-frequency millimeter-wave device testing.
- Electronic Calibration (ECal) Module : Such as N4691D, supports fast automated calibration, reducing calibration time and complexity.
- TRL/LRM Calibration Support : Built-in algorithm supports high-precision fixture and wafer-level measurements.
- Dynamic Uncertainty Analysis : Evaluate the error range of the measurement results to improve data reliability (may require software option support).
Function Expansion and Advanced Measurement
- Mixer Test : Supports frequency conversion loss, return loss, isolation, and group delay measurement; requires built-in function or specific software option.
- Amplifier Characteristics : Gain compression, harmonic distortion (IMD), and pulse RF response analysis; some functions require option support, such as:
- 080 Option : Frequency offset mode, enhances nonlinear measurement accuracy.
- UNL Option : Expands the power range and provides a bias T-type connector, suitable for active device testing.
- 010 Option : Time Domain Reflectometry (TDR), used for filter tuning, fault location, etc.
- Integrated Spectrum Analysis Function : Enables integrated network and spectrum testing; some materials do not clearly state whether a separate option is required.
Software and Automation
- Pulse RF Test Kit : Supports pulse signal measurement and analyzes the response characteristics of devices under pulse excitation; requires option support.
- Nonlinear Measurement Software : Such as mixer test algorithms, including vector error correction technology.
- GPIB/USB/LAN Interface : Supports remote control and automated test processes; standard configuration.
Other Useful Options
- High-Power Test Configuration :
- H85 Option : Expands the power range to support high-power device testing.
- Rack Mounting Kit :
- 19-inch rack mounting bracket : Suitable for standard rack deployment to improve laboratory integration (specific codes should refer to the official documentation).
Notes
- Compatibility Verification : Some options (such as 4-port configuration and high-power testing) need to confirm compatibility with the E8363B hardware version and firmware.
- Calibration Kit Matching : Calibration kits (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5mm)
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