All
  • All
  • Product Management
  • News
%{tishi_zhanwei}%
Product Center
+
  • 下载(1746695701974).png
  • 下载 (1)(1746695702423).png
  • 下载 (2)(1746695701862).png
  • 下载 (3)(1746695702872).png
  • 下载 (4)(1746695702350).png

N5222A PNA Microwave Network Analyzer, 10MHz to 26.5 GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
  • Selection
    • Brand: 是德科技
    • Commodity name: N5222A PNA Microwave Network Analyzer, 10MHz to 26.5 GHz
    • Brand: Keysight Technologies

    High-Performance Vector Network Analyzer N5222A: 26.5GHz Ultra-Wideband Measurement, Reshaping RF Testing Standards
    The N5222A, a classic product in Keysight's PNA series, is a vector network analyzer specifically designed for high-precision testing of RF components. Its frequency coverage ranges from 10 MHz to 26.5 GHz (extensible to 300 kHz with certain configurations), combined with industry-leading dynamic range and flexible calibration techniques, making it widely used in 5G communication, semiconductor research and development, satellite navigation, and other fields, providing engineers with efficient and reliable testing solutions.
    I. Core Technical Indicators
    Ultra-Wide Frequency Coverage and High-Precision Measurement
    The basic N5222A model supports wideband measurements from 10 MHz to 26.5 GHz, meeting the testing needs of most RF components (such as filters, amplifiers, and duplexers). Through optional expansion modules, the frequency range can be further extended to lower frequencies (such as 300 kHz), suitable for low-frequency circuit and material characteristic analysis.
    Industry-Leading Dynamic Range and Stability
    127 dB system dynamic range: Achieves industry-leading signal capture capabilities in the 26.5 GHz band, clearly distinguishing weak signals from strong interference.
    132 dB receiver dynamic range: Coupled with -114 dBm low noise floor (10 Hz IF bandwidth), ensuring measurement accuracy in complex electromagnetic environments.
    <26 microseconds/point measurement speed: Supports 32,001 measurement points and 200 independent channels, significantly improving batch testing efficiency.
    Intelligent Calibration and Multi-Parameter Analysis Capabilities
    Multi-scenario calibration technology: Supports high-precision calibration methods such as TRL/LRM, adapting to complex testing environments such as on-wafer, in-fixture, and waveguide, ensuring measurement consistency in different scenarios. For example, in high-frequency testing, TRL calibration uses three standard components: Through, Reflect, and Line, effectively eliminating errors introduced by the test board and accurately reflecting the performance of the device under test.
    Multi-parameter simultaneous measurement: Can simultaneously analyze key indicators such as S-parameters (continuous wave/pulse), noise figure, gain compression, intermodulation distortion (IMD), and harmonic distortion, meeting the full characteristic characterization needs of active devices such as amplifiers and mixers.
    II. Application Fields and Advantages
    5G Communication and Millimeter-Wave Technology
    The N5222A can accurately analyze the S-parameters of 5G base station RF front-end modules. Its wide dynamic range and low-noise characteristics facilitate efficient debugging of millimeter-wave signals (such as the 28 GHz and 39 GHz bands), shortening product launch cycles. Typical applications include:
    RF chip linearity and power consumption optimization
    Base station filter group delay and insertion loss testing
    Amplitude and phase consistency calibration of millimeter-wave antenna arrays
    Semiconductor and Material Research and Development
    Combined with TRL/LRM calibration technology, the N5222A can perform high-resolution measurements on wafer-level devices, supporting:
    Small-signal/large-signal characteristic analysis of gallium nitride (GaN) power amplifiers
    Dielectric constant testing of high-frequency PCB substrates and new microwave materials
    Process verification and yield improvement of semiconductor processes (such as photolithography and etching)
    Satellite Navigation and Radar Systems
    In satellite communication equipment testing, the N5222A's wide dynamic range and low-noise characteristics can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments:
    Gain and radiation pattern testing of satellite antennas
    Pulse signal analysis and anti-interference capability evaluation of radar components
    Amplitude and phase consistency calibration of phased array radar systems
    III. Design Highlights and User Value
    Modularity and Expandability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research. For example:
    Adding a pulse test module can meet the pulse signal analysis needs of radar systems
    Configuring a multi-port expansion module enables rapid testing of multiple-input and multiple-output (MIMO) antenna systems
    Convenient Operation and Data Management
    The intuitive graphical interface combined with PathWave automated test software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle. For example, software upgrades can add support for the latest communication standards (such as 6G).
    IV. Typical Configurations and Industry Cases
    Basic configuration: 10 MHz to 26.5 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    Expanded configuration: Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    Industry case: A communication equipment manufacturer used the N5222A to optimize 5G base station filters. Using its high-precision measurement data, they successfully reduced insertion loss by 1.2 dB while improving out-of-band suppression performance by 15 dB.
    V. Replacement Models and Technological Evolution
    The N5222A has been discontinued; its functions are inherited by the N5222B and N52 series PNA-X network analyzers. The new generation of products has been upgraded in the following aspects:
    Higher output power: The N5222B's output power in the 1 GHz-10 GHz band is increased to +19 dBm, meeting the testing needs of high-power devices.
    Enhanced Dynamic Range: The N5222B boasts a system dynamic range of 133 dB at 20 GHz, a 6 dB improvement over the N5222A.
    Intelligent Test Process: Automated testing and data analysis are achieved through PathWave software, increasing testing efficiency by over 30%.

  • Hardware Configuration and Expansion

    Option Type Specific Option Function Description Application Scenarios
    Basic Configuration Standard Configuration Frequency range 10 MHz to 26.5 GHz, supports 2-port S-parameter measurement, dynamic range 127 dB, output power +13 dBm. Basic radio frequency device testing, basic network analysis.
    Port Expansion 4-Port Test Fixture Can be upgraded to a 4-port configuration via option (e.g., 4-port test set similar to N5290A-401), supporting multi-port device testing. Multi-port networks (e.g., filters, duplexers), differential devices, antenna array testing.
    Power Expansion UNL Option Expands the power range and integrates a bias T-junction, supporting active device testing (e.g., amplifier gain compression, harmonic analysis). Nonlinear characteristic evaluation of high-power amplifiers, mixers, and frequency converters.

    Calibration and Measurement Enhancement

    Option Type Specific Option Function Description Application Scenarios
    Calibration Kit N7552A Electronic Calibration (ECal) Module Supports fast automated calibration for 3.5 mm or N-type connectors, reducing calibration time and complexity. High-frequency devices, fast calibration for production lines, field testing.
      HP85052B Calibration Kit 3.5 mm calibration kit, supports TRL/LRM calibration technology, suitable for high-precision scenarios such as wafers, fixtures, and waveguides. Wafer-level testing, high-precision laboratory environments, waveguide device measurement.
      HP85056A Calibration Kit 2.4 mm calibration kit, compatible with higher-frequency millimeter-wave device testing. Millimeter-wave components (e.g., antennas, converters), high-frequency material characteristic analysis.
    Calibration Function TRL/LRM Calibration Support Built-in algorithm supports high-precision fixture and wafer-level measurements, can be enhanced via options (e.g., 014 option). Fixture removal, wafer probe station testing, high-loss material measurement.
      Dynamic Uncertainty Analysis Evaluates the error range of measurement results, improving data reliability (may require software option support). Metrology-accredited laboratories, high-precision R&D testing.

    Function Expansion and Advanced Measurement

    Option Type Specific Option Function Description Application Scenarios
    Nonlinear Measurement Mixer Test Kit Supports conversion loss, return loss, isolation, and group delay measurements; requires built-in function or software option. Mixers, frequency converters, RF front-end module testing.
      Amplifier Characteristic Analysis Gain compression, harmonic distortion (IMD), and pulsed RF response analysis; UNL option can expand the power range. Power amplifier, RF transistor, pulsed signal device evaluation.
    Time Domain Analysis 010 Option Time Domain Reflectometry (TDR), used for filter tuning, fault location, and material characteristic analysis. Transmission line fault diagnosis, material dielectric constant measurement, filter debugging.
    Spectrum Analysis Integrated Spectrum Function Realizes integrated network and spectrum testing; some materials do not clearly specify whether a separate option is required. Signal integrity analysis, spectrum purity evaluation, multi-device collaborative testing.

    Software and Automation

    Option Type Specific Option Function Description Application Scenarios
    Built-in Software Pulsed RF Test Kit Supports pulsed signal measurement, analyzes the response characteristics of devices under pulsed excitation; requires option support (e.g., 025 option similar to N5224A). Pulsed amplifiers, radar components, communication equipment pulsed response testing.
      Nonlinear Measurement Software Includes mixer test algorithms, vector error correction technology, improving measurement accuracy. Nonlinear device modeling, advanced RF system design.
    Interface and Control GPIB/USB/LAN Interface Supports remote control and automated test processes; standard configuration. Production line automated testing, multi-instrument collaborative experiments.

    Other Useful Options

    Option Type Specific Option Function Description Application Scenarios
    Rack Mounting 19-inch rack mount Suitable for standard rack deployment, improving laboratory integration (specific codes should refer to the official documentation). Laboratory environment, industrial test system integration.
    Bias T-Junction Integrated into UNL option Provides DC bias capability, suitable for active device testing, without additional configuration. Transistors,

Product Consultation

Please fill out the form below, leave your contact information and needs, and we will be happy to serve you!

*
*
Submit Message