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N5224A PNA Microwave Network Analyzer, 10MHz-43.5GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
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    • Brand: 是德科技
    • Commodity name: N5224A PNA Microwave Network Analyzer, 10MHz-43.5GHz
    • Brand: Keysight Technologies

    N5224A Vector Network Analyzer: 43.5 GHz ultra-wideband measurement, defining a new standard for RF testing

    The N5224A, a classic product in Keysight's PNA series, is a vector network analyzer specifically designed for high-precision testing of high-frequency RF components. Its 10 MHz to 43.5 GHz basic frequency coverage (some configurations extend to 300 kHz), combined with industry-leading dynamic range and flexible calibration technology, is widely used in 5G communication, millimeter-wave technology, and semiconductor R&D, providing engineers with efficient and reliable testing solutions.

    I. Core Technical Indicators

    Ultra-wide Frequency Coverage and High-Precision Measurement
    The basic N5224A model supports 10 MHz to 43.5 GHz wideband measurement, meeting the testing needs of most RF components (such as filters, amplifiers, and duplexers). Through optional expansion modules, the frequency range can be further extended to lower frequency bands (such as 300 kHz), suitable for low-frequency circuits and material characteristic analysis.
    Industry-Leading Dynamic Range and Stability
    • 127 dB system dynamic range : Achieves industry-leading signal acquisition capabilities in the 43.5 GHz band, clearly distinguishing weak signals from strong interference.
    • 132 dB receiver dynamic range : Coupled with -114 dBm low noise floor (10 Hz IF bandwidth), ensuring measurement accuracy in complex electromagnetic environments.
    • <26 microseconds/point measurement speed : Supports 32,001 measurement points and 200 independent channels, significantly improving batch testing efficiency.
    Intelligent Calibration and Multi-parameter Analysis Capabilities
    • Multi-scenario calibration technology : Supports high-precision calibration methods such as TRL/LRM, adapting to complex testing environments such as on-wafer, in-fixture, and waveguide, ensuring measurement consistency in different scenarios. For example, in high-frequency testing, TRL calibration uses three standard components: Through, Reflect, and Line, effectively eliminating errors introduced by the test board and accurately reflecting the performance of the device under test.
    • Multi-parameter synchronous measurement : Can simultaneously analyze key indicators such as S-parameters (continuous wave/pulse), noise figure, gain compression, intermodulation distortion (IMD), and harmonic distortion, meeting the full characteristic characterization needs of active devices such as amplifiers and mixers.

    II. Application Areas and Advantages

    5G Communication and Millimeter-Wave Technology
    The N5224A can accurately analyze the S-parameters of 5G base station RF front-end modules. Its wide dynamic range and low-noise characteristics facilitate efficient debugging of millimeter-wave signals (such as 28 GHz and 39 GHz bands), shortening product launch cycles. Typical applications include:
    • RF chip linearity and power consumption optimization
    • Base station filter group delay and insertion loss testing
    • Amplitude and phase consistency calibration of millimeter-wave antenna arrays
    Semiconductor and Material R&D
    With TRL/LRM calibration technology, the N5224A can perform high-resolution measurements on wafer-level devices, supporting:
    • Small-signal/large-signal characteristic analysis of gallium nitride (GaN) power amplifiers
    • Dielectric constant testing of high-frequency PCB substrates and new microwave materials
    • Process verification and yield improvement of semiconductor processes (such as lithography and etching)
    Satellite Navigation and Radar Systems
    In satellite communication equipment testing, the N5224A's wide dynamic range and low-noise characteristics can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments:
    • Gain and radiation pattern testing of satellite antennas
    • Pulse signal analysis and anti-interference capability evaluation of radar components
    • Amplitude and phase consistency calibration of phased array radar systems

    III. Design Highlights and User Value

    Modularity and Expandability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research. For example:
    • Adding a pulse test module (such as N5224A-021/022) can meet the pulse signal analysis needs of radar systems
    • Configuring a multi-port expansion module enables rapid testing of multiple-input and multiple-output (MIMO) antenna systems
    Convenient Operation and Data Management
    The intuitive graphical interface combined with PathWave automated test software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle. For example, software upgrades can add support for the latest communication standards (such as 6G)

    IV. Typical Configurations and Industry Cases

    • Basic Configuration : 10 MHz to 43.5 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    • Extended Configuration : Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    • Industry Cases : A communication equipment manufacturer used the N5224A to optimize 5G base station filters. Using its high-precision measurement data, they successfully reduced insertion loss by 1.2 dB while improving out-of-band suppression performance by 15 dB.

    V. Alternative Models and Technological Evolution

    The N5224A has been discontinued, and its functions are now provided by N5224B and the N52 series PNA-X network analyzers The new generation of products has been upgraded in the following aspects:


     

    • Higher output power The N5224B's output power in the 1GHz-10GHz band has been increased to +19 dBm, meeting the testing needs of high-power devices.
    • Stronger dynamic range The N5224B achieves a system dynamic range of 133 dB at 20 GHz, a 6 dB improvement over the N5224A.
    • Intelligent test process Automated testing and data analysis are achieved through PathWave software, improving testing efficiency by over 30%
  • Hardware Configuration and Expansion

    Option Type Specific Option Function Description Application Scenarios
    Basic Configuration N5224A-200 Frequency range 10 MHz to 43.5 GHz, supporting 2-port S-parameter measurement, dynamic range 127 dB, output power +13 dBm. Basic radio frequency device testing, preliminary evaluation of millimeter-wave components.
    Port Expansion N5224A-401 Upgrade to 4-port configuration (including 2 built-in signal sources), supporting synchronous measurement of multi-port devices. Multi-port network (such as filters, duplexers), differential devices, antenna array testing.
    Power Expansion N5224A-219 Expands the power range and integrates a bias T-junction, supporting active device testing (such as amplifier gain compression, harmonic analysis). Nonlinear characteristic evaluation of high-power amplifiers, mixers, and frequency converters.

    Calibration and Measurement Enhancement

    Option Type Specific Option Function Description Application Scenarios
    Calibration Kit N7552A Electronic Calibration (ECal) Module Supports fast automated calibration for 3.5 mm or N-type connectors, reducing calibration time and complexity. High-frequency devices, fast calibration for production lines, field testing.
      HP85052B Calibration Kit 3.5 mm calibration kit, supporting TRL/LRM calibration technology, suitable for high-precision scenarios such as wafers, fixtures, and waveguides. Wafer-level testing, high-precision laboratory environments, waveguide device measurement.
    Calibration Function N5224A-551 Supports N-port calibration measurement, suitable for accurate calibration of multi-port networks. Multi-port devices (such as 4-port filters), complex system integration testing.
      Dynamic Uncertainty Analysis Evaluates the error range of measurement results and improves data reliability (requires software options). Metrology certified laboratories, high-precision R&D testing.

    Function Expansion and Advanced Measurement

    Option Type Specific Option Function Description Application Scenarios
    Nonlinear Measurement N5224A-086 Built-in gain compression analysis algorithm, supporting amplifier characteristic evaluation. Nonlinear behavior testing of power amplifiers and RF transistors.
     N5224A-087 Intermodulation distortion (IMD) measurement, supporting multi-tone signal analysis. Spurious suppression evaluation of RF front-end modules and mixers.
    Time Domain Analysis N5224A-010 Time domain reflectometry (TDR), used for filter tuning, fault location, and material property analysis. Transmission line fault diagnosis, material dielectric constant measurement, filter debugging.
    Spectrum Analysis N5224A-090 Integrated spectrum function, realizing integrated network and spectrum testing. Signal integrity analysis, spectrum purity evaluation, multi-device collaborative testing.
    Pulse RF Testing N5224A-008 Supports pulse signal measurement, analyzing the response characteristics of devices under pulse excitation. Pulse amplifier, radar component, communication equipment pulse response testing.
     N5224A-025 Adds 4 pulse modulators, expanding the flexibility of pulse testing. Complex pulse sequence generation, multi-channel synchronous testing.

    Software and Automation

    Option Type Specific Option Function Description Application Scenarios
    Built-in Software Nonlinear Measurement Software Includes mixer testing algorithms and vector error correction technology to improve measurement accuracy. Nonlinear device modeling, advanced RF system design.
    Interface and Control GPIB/USB/LAN Interface Supports remote control and automated testing processes, standard configuration. Production line automated testing, multi-instrument collaborative experiments.

    Other Useful Options

    Option Type Specific Option Function Description Application Scenarios
    Rack Mounting 19-inch rack mount Suitable for standard rack deployment, improving laboratory integration (specific code should refer to the official documentation). Laboratory environment, industrial test system integration.
    Bias T-junction Integrated into N5224A-219 Provides DC bias capability, suitable for active device testing, no additional configuration required. Transistor, diode, radio frequency integrated circuit (RFIC) testing.

    Key Tips

    Compatibility Verification
    • Options such as 4-port expansion (N5224A-401), high-power testing (N5224A-219), and pulse RF test kits (N5224A-008/025) need to confirm compatibility with the N5224A hardware version and firmware.
    • Some options (such as N5224A-015) require software activation, it is recommended to obtain detailed information through official technical support.
    Calibration Kit Matching
    • Calibration parts (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5 mm) to avoid affecting measurement accuracy.
     

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