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N5225A PNA microwave network analyzer, 10MHz-50GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
  • Selection
    • Brand: 是德科技
    • Commodity name: N5225A PNA microwave network analyzer, 10MHz-50GHz
    • Brand: Keysight Technologies

    High-Performance Vector Network Analyzer N5225A: 50GHz Ultra-Wideband Measurement, Reshaping the Benchmark for High-Frequency Testing
    The N5225A, a classic product in Keysight's PNA series, is a vector network analyzer specifically designed for high-precision testing of high-frequency RF components. Its basic frequency coverage ranges from 10 MHz to 50 GHz (extensible to 300 kHz with certain configurations), combined with industry-leading dynamic range and flexible calibration technology, making it widely used in 5G communication, millimeter-wave technology, and semiconductor research and development, providing engineers with efficient and reliable testing solutions.
    I. Core Technical Indicators
    Ultra-Wide Frequency Coverage and High-Precision Measurement
    The basic N5225A model supports wideband measurement from 10 MHz to 50 GHz, meeting the testing needs of most RF components (such as filters, amplifiers, and duplexers). Through optional expansion modules, the frequency range can be further extended to lower frequency bands (such as 300 kHz), suitable for low-frequency circuit and material characteristic analysis.
    Industry-Leading Dynamic Range and Stability
    127 dB system dynamic range: Achieves industry-leading signal acquisition capabilities in the 50 GHz band, clearly distinguishing weak signals from strong interference.
    132 dB receiver dynamic range: Coupled with -114 dBm low noise floor (10 Hz IF bandwidth), ensuring measurement accuracy in complex electromagnetic environments.
    <26 microseconds/point measurement speed: Supports 32,001 measurement points and 200 independent channels, significantly improving batch testing efficiency.
    Intelligent Calibration and Multi-Parameter Analysis Capabilities
    Multi-scenario calibration technology: Supports high-precision calibration methods such as TRL/LRM, adapting to complex testing environments such as on-wafer, in-fixture, and waveguide, ensuring measurement consistency in different scenarios. For example, in high-frequency testing, TRL calibration uses three standard components: Through, Reflect, and Line, effectively eliminating errors introduced by the test board and accurately reflecting the performance of the device under test.
    Simultaneous multi-parameter measurement: Can simultaneously analyze key indicators such as S-parameters (continuous wave/pulse), noise figure, gain compression, intermodulation distortion (IMD), and harmonic distortion, meeting the full characteristic characterization needs of active devices such as amplifiers and mixers.
    II. Application Areas and Advantages
    5G Communication and Millimeter-Wave Technology
    The N5225A can accurately analyze the S-parameters of 5G base station RF front-end modules. Its wide dynamic range and low-noise characteristics facilitate efficient debugging of millimeter-wave signals (such as the 28 GHz and 39 GHz bands), shortening product launch cycles. Typical applications include:
    RF chip linearity and power consumption optimization
    Base station filter group delay and insertion loss testing
    Amplitude and phase consistency calibration of millimeter-wave antenna arrays
    Semiconductor and Material Research and Development
    With TRL/LRM calibration technology, the N5225A can perform high-resolution measurements on wafer-level devices, supporting:
    Small-signal/large-signal characteristic analysis of gallium nitride (GaN) power amplifiers
    Dielectric constant testing of high-frequency PCB substrates and new microwave materials
    Process verification and yield improvement of semiconductor processes (such as lithography and etching)
    Satellite Navigation and Radar Systems
    In satellite communication equipment testing, the N5225A's wide dynamic range and low-noise characteristics can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments:
    Gain and radiation pattern testing of satellite antennas
    Pulse signal analysis and anti-interference capability evaluation of radar components
    Amplitude and phase consistency calibration of phased array radar systems
    III. Design Highlights and User Value
    Modularity and Expandability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research. For example:
    Adding a pulse test module (such as N5225A-008) can meet the pulse signal analysis needs of radar systems
    Configuring a multi-port expansion module enables rapid testing of multiple-input and multiple-output (MIMO) antenna systems
    Convenient Operation and Data Management
    The intuitive graphical interface combined with PathWave automated test software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle. For example, software upgrades can add support for the latest communication standards (such as 6G).
    IV. Typical Configurations and Industry Cases
    Basic configuration: 10 MHz to 50 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    Expanded configuration: Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    Industry case: A communication equipment manufacturer used the N5225A to optimize 5G base station filters. Using its high-precision measurement data, they successfully reduced insertion loss by 1.2 dB while improving out-of-band suppression performance by 15 dB.
    V. Replacement Models and Technological Evolution
    The N5225A has been discontinued; its functions are inherited by the N5225B and N52 series PNA-X network analyzers. The new generation of products has been upgraded in the following aspects:
    Higher dynamic range: The N5225B has a system dynamic range of 134 dB at 20 GHz, a 7 dB improvement over the N5225A.
    Intelligent test process: Automated testing and data analysis are achieved through PathWave software, improving testing efficiency by more than 30%.
    Enhanced High-Frequency Performance: The N5225B maintains a +11 dBm output power even at 67 GHz, meeting the needs of higher-frequency band testing

  • Hardware Configuration and Expansion

    Option Type Specific Option Function Description Application Scenarios
    Basic Configuration N5225A-200 Frequency range 10 MHz to 50 GHz, supporting 2-port S-parameter measurement, dynamic range 127 dB, output power +13 dBm. Basic radio frequency device testing, preliminary evaluation of millimeter-wave components.
    Port Expansion N5225A-400 Upgrade to a 4-port configuration (including 2 built-in signal sources), supporting synchronous measurement of multi-port devices. Multi-port network (such as filters, duplexers), differential devices, antenna array testing.
    Power Expansion N5225A-219 Expands the power range and integrates a bias T-junction, supporting active device testing (such as amplifier gain compression, harmonic analysis). Nonlinear characteristic evaluation of high-power amplifiers, mixers, and frequency converters.
     N5225A-419 Expands the power range in the 4-port configuration and integrates a bias T-junction, suitable for complex multi-port active device testing. Multi-port radio frequency front-end modules, multi-channel amplifier array testing.

    Calibration and Measurement Enhancement

    Option Type Specific Option Function Description Application Scenarios
    Calibration Kit N7552A Electronic Calibration (ECal) Module Supports fast automated calibration for 3.5 mm or N-type connectors, reducing calibration time and complexity. High-frequency devices, fast calibration for production lines, field testing.
      HP85052B Calibration Kit 3.5 mm calibration kit, supporting TRL/LRM calibration technology, suitable for high-precision scenarios such as wafers, fixtures, and waveguides. Wafer-level testing, high-precision laboratory environments, waveguide device measurement.
    Calibration Function N5225A-551 Supports N-port calibration measurement, suitable for accurate calibration of multi-port networks. Multi-port devices (such as 4-port filters), complex system integration testing.
     N5225A-015 Dynamic uncertainty analysis, evaluating the error range of measurement results, and improving data reliability. Metrology-certified laboratories, high-precision R&D testing.

    Function Expansion and Advanced Measurement

    Option Type Specific Option Function Description Application Scenarios
    Nonlinear Measurement N5225A-086 Built-in gain compression analysis algorithm, supporting amplifier characteristic evaluation. Nonlinear behavior testing of power amplifiers and radio frequency transistors.
     N5225A-087 Intermodulation distortion (IMD) measurement, supporting multi-tone signal analysis. Stray suppression evaluation of radio frequency front-end modules and mixers.
    Time Domain Analysis N5225A-010 Time domain reflectometry (TDR), used for filter tuning, fault location, and material property analysis. Transmission line fault diagnosis, material dielectric constant measurement, filter debugging.
    Spectrum Analysis N5225A-090 Integrated spectrum function, realizing integrated network and spectrum testing. Signal integrity analysis, spectrum purity evaluation, multi-device collaborative testing.
    Millimeter-wave Expansion N5225A-093 Expands spectrum analysis to 110 GHz, supporting millimeter-wave component testing. Millimeter-wave antennas, converters, high-frequency material property analysis.
    Pulse Radio Frequency Testing N5225A-008 Supports pulse signal measurement, analyzing the response characteristics of devices under pulse excitation. Pulse amplifier, radar component, communication equipment pulse response testing.
     N5225A-025 Adds 4 internal pulse generators, expanding the flexibility of pulse testing. Complex pulse sequence generation, multi-channel synchronous testing.

    Software and Automation

    Option Type Specific Option Function Description Application Scenarios
    Built-in Software N5225A-897 Built-in performance testing software, supporting comprehensive calibration and long-term licenses. Production line automated testing, multi-instrument collaborative experiments.
     N5225A-007 Automatic Fixture Removal (AFR) function, simplifying the fixture calibration process. Fixture removal, wafer probe station testing, high-loss material measurement.
    Interface and Control GPIB/USB/LAN Interface Supports remote control and automated testing processes, as standard configuration. Production line automated testing, multi-instrument collaborative experiments.

    Other Useful Options

    Option Type Specific Option Function Description Application Scenarios
    Rack Mounting N5225A-1CP 19-inch rack mount (with handle), suitable for standard rack deployment. Laboratory environment, industrial test system integration.
     N5225A-1CM 19-inch rack mount (without handle), suitable for compact space deployment. Laboratory environment, industrial test system integration.
    Bias T-junction Integrated into N5225A-219/N5225A-419 Provides DC bias capability, suitable for active device testing, without additional configuration. Transistor, diode, radio frequency integrated circuit (RFIC) testing.

    Key Tips

    Compatibility Verification
    • Compatibility of optional accessories such as the 4-port extension (N5225A-400), high-power test (N5225A-219), and pulse RF test kit (N5225A-008/025) with the N5225A hardware version and firmware needs to be confirmed.
    • Some optional accessories (such as N5225A-089) require software activation. It is recommended to contact official technical support for detailed information.
    Calibration Kit Matching
    • Calibration components (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5 mm) to avoid affecting measurement accuracy.

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