All
  • All
  • Product Management
  • News
%{tishi_zhanwei}%
Product Center
+
  • Q.png
  • 下载 (1)(1746697610775).png
  • 下载 (2)(1746697610183).png
  • 下载 (3)(1746697610762).png
  • 下载 (4)(1746697611459).png
  • 下载 (5)(1746697613761).png
  • 下载(1746697613272).png

N5249A PNA-X Microwave Network Analyzer, 10MHz-8.5GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
  • Selection
    • Brand: 是德科技
    • Commodity name: N5249A PNA-X Microwave Network Analyzer, 10MHz-8.5GHz
    • Brand: Keysight Technologies

    High-Performance Vector Network Analyzer N5249A: 8.5 GHz Precision Test Platform, a Core Tool for Linear and Non-linear Device Characterization

    The N5249A is a classic product of Keysight's PNA-X series, specifically designed for high-precision testing of RF components. Its frequency coverage from 10 MHz to 8.5 GHz, combined with industry-leading dynamic range and flexible calibration technology, is widely used in 5G communication, semiconductor research and development, satellite navigation, and other fields, providing engineers with efficient and reliable testing solutions.

    I. Core Technical Indicators

    Wideband Coverage and High-Precision Measurement
    The N5249A basic model supports 10 MHz to 8.5 GHz wideband measurement, meeting the testing needs of most RF components (such as amplifiers, mixers, and filters). Through the built-in dual signal source and synthesis network, synchronous analysis of continuous wave (CW) and pulsed signals can be achieved, suitable for the full characteristic characterization of complex RF systems.
    Excellent Dynamic Range and Stability
    • 126 dB system dynamic range : Achieves industry-leading signal acquisition capabilities in the 8.5 GHz band, clearly distinguishing weak signals from strong interference.
    • 129 dB receiver dynamic range : Coupled with -111 dBm low noise floor (10 Hz IF bandwidth), ensuring measurement accuracy in complex electromagnetic environments.
    • <26 microseconds/point measurement speed : Supports 32,001 measurement points and 200 independent channels, significantly improving batch testing efficiency.
    Intelligent Calibration and Multi-parameter Analysis Capabilities
    • Multi-scenario calibration technology : Supports high-precision calibration methods such as TRL/LRM, adapting to complex testing environments such as on-wafer, in-fixture, and waveguide, ensuring measurement consistency in different scenarios. For example, in high-frequency testing, TRL calibration uses three standard components: Through, Reflect, and Line, effectively eliminating errors introduced by the test board and accurately reflecting the performance of the device under test.
    • Multi-parameter synchronous measurement : Can simultaneously analyze key indicators such as S-parameters (continuous wave/pulse), noise figure, gain compression, intermodulation distortion (IMD), and harmonic distortion, meeting the full characteristic characterization needs of active devices such as amplifiers and mixers. Its patented mixer calibration technology maintains amazing measurement stability even under extreme temperature fluctuations.

    II. Application Fields and Advantages

    5G Communication and Sub-6GHz Technology
    The N5249A can accurately analyze the S-parameters of 5G base station RF front-end modules. Its wide dynamic range and low-noise characteristics facilitate efficient debugging of Sub-6GHz signals (such as 2.6 GHz and 3.5 GHz bands), shortening product launch cycles. Typical applications include:
    • Linearity and power consumption optimization of RF chips
    • Group delay and insertion loss testing of base station filters
    • Amplitude and phase consistency calibration of multiple-input and multiple-output (MIMO) antenna systems
    Semiconductor and Material Research and Development
    With TRL/LRM calibration technology, the N5249A can perform high-resolution measurements on wafer-level devices, supporting:
    • Small-signal/large-signal characteristic analysis of gallium nitride (GaN) power amplifiers
    • Dielectric constant testing of high-frequency PCB substrates and new microwave materials
    • Process verification and yield improvement of semiconductor processes (such as photolithography and etching)
    Satellite Navigation and Radar Systems
    In satellite communication equipment testing, the wide dynamic range and low-noise characteristics of the N5249A can effectively evaluate the performance of transmit/receive modules, ensuring system reliability in complex electromagnetic environments:
    • Gain and radiation pattern testing of satellite antennas
    • Pulse signal analysis and anti-interference capability evaluation of radar components
    • Amplitude and phase consistency calibration of phased array radar systems

    III. Design Highlights and User Value

    Modularity and Scalability
    The instrument supports optional functional modules such as time-domain analysis and vector error correction. Users can flexibly configure according to their needs, adapting to diverse scenarios from basic testing to high-end research. For example:
    • Adding a pulse test module (such as N5249A-008) can meet the pulse signal analysis needs of radar systems
    • Configuring a multi-port expansion module can enable rapid testing of multiple-input and multiple-output (MIMO) antenna systems
    Convenient Operation and Data Management
    The intuitive graphical interface combined with PathWave automated test software simplifies the operation process and generates professional reports. Data storage and export functions support seamless integration into R&D management systems, improving collaboration efficiency.
    Long-Term Investment Protection
    Keysight's hardware design and calibration algorithms ensure that the instrument maintains high accuracy during long-term use, while the modular design supports future functional upgrades, extending the equipment's life cycle. For example, software upgrades can add support for the latest communication standards (such as 6G).

    IV. Typical Configurations and Industry Cases

    • Basic Configuration : 10 MHz to 8.5 GHz frequency range, 2-port measurement, suitable for conventional RF component testing.
    • Extended Configuration : Adding a pulse test module or multi-port expansion can meet the complex testing needs of radar systems and high-speed communication equipment.
    • Industry Cases A certain telecommunications equipment manufacturer used the N5249A to optimize 5G base station filters. Using its high-precision measurement data, they successfully reduced insertion loss by 1.2 dB while improving out-of-band suppression performance by 15 dB.
  • Hardware Configuration and Expansion

    Option Type Specific Option Function Description Application Scenarios
    Basic Configuration N5249A-200 Frequency range 10 MHz to 8.5 GHz, supporting 2-port S-parameter measurement, dynamic range 127 dB, output power +13 dBm. Basic radio frequency device testing, low-frequency component evaluation.
    Port Expansion N5249A-400 Upgrade to a 4-port configuration (including 2 built-in signal sources), supporting synchronous measurement of multi-port devices. Multi-port network (such as filters, duplexers), differential devices, antenna array testing.
    Power Expansion N5249A-219 Expands the power range and integrates a bias T-junction, supporting active device testing (such as amplifier gain compression, harmonic analysis). Nonlinear characteristic evaluation of high-power amplifiers, mixers, and frequency converters.
     N5249A-419 Expands the power range in the 4-port configuration and integrates a bias T-junction, suitable for complex multi-port active device testing. Multi-port radio frequency front-end modules, multi-channel amplifier array testing.

    Calibration and Measurement Enhancement

    Option Type Specific Option Function Description Application Scenarios
    Calibration Kit N7552A Electronic Calibration (ECal) Module Supports fast automated calibration for 3.5 mm or N-type connectors, reducing calibration time and complexity. High-frequency devices, fast calibration for production lines, field testing.
      HP85052B Calibration Kit 3.5 mm calibration kit, supporting TRL/LRM calibration technology, suitable for high-precision scenarios such as wafers, fixtures, and waveguides. Wafer-level testing, high-precision laboratory environments, waveguide device measurement.
    Calibration Function N5249A-551 Supports N-port calibration measurement, suitable for accurate calibration of multi-port networks. Multi-port devices (such as 4-port filters), complex system integration testing.
     N5249A-015 Dynamic uncertainty analysis, evaluating the error range of measurement results, and improving data reliability. Metrology-certified laboratories, high-precision R&D testing.

    Function Expansion and Advanced Measurement

    Option Type Specific Option Function Description Application Scenarios
    Nonlinear Measurement N5249A-086 Built-in gain compression analysis algorithm, supporting amplifier characteristic evaluation. Nonlinear behavior testing of power amplifiers and radio frequency transistors.
     N5249A-087 Intermodulation distortion (IMD) measurement, supporting multi-tone signal analysis. Stray suppression evaluation of radio frequency front-end modules and mixers.
    Time Domain Analysis N5249A-010 Time domain reflectometry (TDR) measurement, used for filter tuning, fault location, and material property analysis. Transmission line fault diagnosis, material dielectric constant measurement, filter debugging.
    Spectrum Analysis N5249A-090 Integrated spectrum function, realizing integrated network and spectrum testing. Signal integrity analysis, spectrum purity evaluation, multi-device collaborative testing.
    Pulse Radio Frequency Testing N5249A-008 Supports pulse signal measurement, analyzing the response characteristics of devices under pulse excitation. Pulse amplifier, radar component, communication equipment pulse response testing.
     N5249A-025 Adds 4 internal pulse generators, expanding pulse testing flexibility. Complex pulse sequence generation, multi-channel synchronous testing.
    Noise Figure Measurement N5249A-028 Standard receiver noise figure measurement, supporting frequency converter evaluation. Low-noise amplifier (LNA), mixer noise characteristic analysis.

    Software and Automation

    Option Type Specific Option Function Description Application Scenarios
    Built-in Software N5249A-007 Automatic Fixture Removal (AFR) function, simplifying the fixture calibration process. Fixture removal, wafer probe station testing, high-loss material measurement.
    Interface and Control GPIB/USB/LAN Interface Supports remote control and automated testing processes, as standard configuration. Production line automated testing, multi-instrument collaborative experiments.

    Other Useful Options

    Option Type Specific Option Function Description Application Scenarios
    Bias T-junction Integrated into N5249A-219/N5249A-419 Provides DC bias capability, suitable for active device testing, without additional configuration. Transistor, diode, radio frequency integrated circuit (RFIC) testing.
    Rack Mounting 19-inch rack mount Suitable for standard rack deployment (specific code should refer to the official documentation). Laboratory environment, industrial test system integration.

    Key Tips

    Compatibility Verification
    • Compatibility of options such as the 4-port extension (N5249A-400), high-power test (N5249A-219), and pulse RF test kit (N5249A-008/025) with the N5249A hardware version and firmware needs to be confirmed.
    • Some options (such as N5249A-089) require software activation. It is recommended to contact official technical support for detailed information.
    Calibration Kit Matching
    • Calibration items (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5 mm) to avoid affecting measurement accuracy

Product Consultation

Please fill out the form below, leave your contact information and needs, and we will be happy to serve you!

*
*
Submit Message