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N5241A PNA-X Microwave Network Analyzer, 10MHz-13.5GHz
Category:
Network analyzer
Desktop network analyzer
Product Attachment:
- Product Description
- Selection
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- Brand: 是德科技
- Commodity name: N5241A PNA-X Microwave Network Analyzer, 10MHz-13.5GHz
- Brand: Keysight Technologies
High-Performance Vector Network Analyzer N5241A: A 26.5 GHz precision test platform, a core tool for high-frequency component and system-level characterization
I. Core Technical Indicators and Performance Advantages
- 130 dB system dynamic range (26.5 GHz) : Maintains high signal resolution capability over a wide frequency band, capable of clearly capturing weak signals at the -110 dBm level, suitable for noise coefficient testing of sensitive devices such as low-noise amplifiers (LNAs).
- <28 microseconds/point measurement speed : Supports fast frequency sweeping and multi-port synchronous measurement, significantly improving the efficiency of batch testing on production lines, especially suitable for amplitude-phase consistency calibration of large-scale MIMO antenna arrays.
- -114 dBm background noise (10 Hz intermediate frequency bandwidth) : Maintains an extremely low noise base even at high frequencies, ensuring accurate characterization of the distortion characteristics of nonlinear devices (such as mixers and frequency converters).
- Full-scenario calibration technology : Supports TRL/LRM, electronic calibration components (ECal), and non-insertion calibration, adapting to complex testing environments such as wafer probe stations, waveguide fixtures, and system-on-chip (SoC) packaging, eliminating errors introduced by mechanical connections and dielectric losses. For example, for millimeter-wave wafer testing, TRL calibration combined with probe parasitic parameter compensation can reduce measurement uncertainty to below 0.05 dB.
- Multi-domain Synchronous Analysis : Can simultaneously obtain key indicators such as S-parameters (continuous wave and pulse modes), gain compression (P1dB), third-order intermodulation (IMD3), harmonic distortion (HD2/HD3), and noise figure (NF), without switching test modes, comprehensively simplifying the multi-characteristic characterization process of active devices.
II. Typical Application Areas
- Linear and nonlinear characteristic analysis of millimeter-wave front-end modules (such as power amplifiers and switch arrays)
- Amplitude/phase consistency calibration and beamforming testing of phased array antenna units
- Precision measurement of the dielectric constant and loss tangent of high-frequency PCB materials (such as Rogers and LCP)
- Gain flatness and out-of-band suppression testing of satellite transponders and low-earth orbit (LEO) payload components
- Time-domain response analysis of pulse radar front ends (with time-domain gating function)
- Amplitude-phase error calibration of phased array radar T/R components to ensure system-level beam pointing accuracy
- Small-signal S-parameter and large-signal load-pull testing of wafer-level devices (requires external load-pull system)
- Extraction of high-frequency parasitic parameters of passive components such as on-chip spiral inductors and MIM capacitors
- Loss characteristic analysis of on-chip interconnect structures (such as microstrip lines and coplanar waveguides) in process verification
III. Design Highlights and User Value
- Pulse test module : Achieves transient characteristic analysis of nanosecond-level pulse signals, suitable for radar pulse device testing
- Multi-port expansion (4/6/8 ports) : Supports multi-channel parallel measurement of MIMO antenna systems, improving testing efficiency by more than 50%
- Time-domain analysis function : Locates internal discontinuities in devices (such as solder joint defects and dielectric layering) through frequency-domain-time-domain transformation
- Graphical user interface : Supports touch operation and customized measurement processes, reducing engineer training costs
- PathWave automation software Built-in template testing sequence, which can generate professional reports including measurement data, curves, and statistical analysis with one click, and supports seamless integration with tools such as LabVIEW and MATLAB to achieve digital management of the R&D process
IV. Replacement Models and Technological Evolution
- Higher frequency coverage The N5241B supports up to 43.5 GHz, meeting the early R&D needs of the 6G terahertz band
- Dynamic range improvement At 26.5 GHz, the system dynamic range reaches 135 dB, and the noise figure measurement accuracy is improved by 15%
- AI-assisted calibration Introducing machine learning algorithms to optimize the calibration process, reducing calibration time by 40% in complex scenarios
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Hardware Configuration and Expansion
Calibration and Measurement Enhancement
Function Expansion and Advanced Measurement
Software and Automation
Other Useful Options
Key Tips
- Options such as 4-port extension (N5241A-400), high-power test (N5241A-219), and pulse RF test kit (N5241A-008/025) require compatibility confirmation with the N5241A hardware version and firmware. 。
- Some options (such as N5241A-089) require software activation. It is recommended to contact official technical support for detailed information.
- Calibration components (such as HP85052B) must strictly match the test frequency range and connector type (such as 3.5 mm) to avoid affecting measurement accuracy.
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Add.: 2nd Floor, Building C, Zhongzhi Zhichuang Park, Yucui Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province, China
Tel: +86-135 1042 6680
Email: harriosn@sengt.com
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