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N5245A PNA-X Microwave Network Analyzer, 10MHz-50GHz

Category:

Network analyzer

Desktop network analyzer


  • Product Description
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    • Brand: 是德科技
    • Commodity name: N5245A PNA-X Microwave Network Analyzer, 10MHz-50GHz
    • Brand: Keysight Technologies
    The N5245A is a high-performance PNA-X Series vector network analyzer from Keysight Technologies. Details are provided below:

    Key Technical Specifications

    • Frequency Range : 10MHz to 50GHz, covering numerous RF and microwave frequency bands to meet the testing needs of various devices.
    • Dynamic Range : System dynamic range of 126dB, receiver dynamic range of 129dB, enabling accurate measurement of weak and strong signals, effectively distinguishing signals of different amplitudes.
    • Measurement Points and Channels : Supports 32,001 measurement points and 32 channels for detailed and comprehensive analysis of the device under test.
    • Intermediate Frequency Bandwidth : Selectable 5MHz or 15MHz intermediate frequency bandwidth to optimize measurement speed and resolution.
    • Output Power and Harmonics : Output power up to +16dBm, harmonic distortion as low as -60dBc, providing high-purity test signal excitation.
    • Noise Floor : Noise floor as low as -111dBm at 10Hz IF bandwidth, facilitating accurate measurement of low-noise devices.

    Functional Characteristics

    • Multi-port and Dual-source Configuration : Available in 2-port or 4-port configurations, and features two built-in signal sources. Combined with the built-in combiner and internal signal routing switch, it offers excellent configurability for various complex test scenarios.
    • Extensive Measurement Capabilities : Can perform measurements of various parameters such as S-parameters (continuous wave and pulse modes), noise figure, gain compression, intermodulation distortion, harmonic distortion, conversion gain/loss, etc. It also supports true differential stimulus, millimeter-wave measurements, nonlinear waveforms, and X-parameter characterization, enabling comprehensive performance evaluation of the device under test.
    • Time-domain Analysis Capabilities : Obtains the time-domain response by performing an inverse Fourier transform on the frequency-domain data, helping engineers analyze discontinuities and reflection issues in devices. This is particularly useful when locating faults in transmission lines or evaluating the transient response of filters.
    • Calibration Functions : Supports various calibration methods, including electronic calibration kit (ECal) calibration, enabling rapid high-precision calibration to ensure the accuracy and reliability of measurement results.

    Application Scenarios

    • Wireless Communication : In the research and development and production of wireless communication technologies such as 5G and Wi-Fi, it can be used to test the performance of RF front-end modules, filters, power amplifiers, and antennas, ensuring that they meet relevant standards and specifications, and helping to optimize the performance of wireless communication systems.
    • Microwave and Millimeter-wave Device Testing : Suitable for the research, development, and production testing of various microwave devices such as microwave oscillators, mixers, attenuators, and phase shifters, as well as millimeter-wave devices. It can accurately measure their various performance parameters, providing strong support for device design optimization and quality control.
    • Aerospace and Defense : In military applications such as radar systems, satellite communications, and electronic warfare, it can be used to test the performance of antennas, RF components, and systems, meeting the stringent requirements of military equipment for high-precision and high-reliability RF testing, such as directionality measurements of radar antennas and linearity and noise performance evaluation of RF transceiver components.
    • Semiconductor Industry : In the semiconductor chip manufacturing process, it can be used to test on-chip RF devices and packaged RF modules, helping chip design engineers extract high-frequency parameters of devices, optimize chip design schemes, and improve the RF performance and reliability of chips.
  •  
    Option Description Application Scenarios
    N5245A - 219 2 ports, increased power range and bias Suitable for testing scenarios that require extending the power range and controlling the bias of 2-port devices, such as testing amplifiers and filters that require specific bias voltages.
    N5245A - 224 2 ports, added internal second source and mechanical switch Used in 2-port tests when an additional signal source is needed for complex excitation combinations, or when a mechanical switch is required to switch signal paths, such as for frequency conversion testing of mixers, providing different frequency inputs from two signal sources.
    N5245A - 400 4 ports, dual source For testing 4-port devices, such as four-channel amplifiers and couplers, the dual source provides a more flexible excitation method, allowing simultaneous input and measurement of different signals on multiple ports.
    N5245A - 423 4 ports, added internal combiner and mechanical switch In 4-port testing, scenarios requiring signal combination or switching, such as testing multi-channel communication equipment, where the internal combiner combines signals from different signal sources before inputting them to the device under test, and then switches the measurement path using a mechanical switch.
    N5245A - 020 Added intermediate frequency input Used when connecting an external intermediate frequency signal for further processing or analysis, such as using it with external intermediate frequency filters and amplifiers to expand the processing capability of intermediate frequency signals.
    N5245A - 022 Added pulse modulator to the internal second source Suitable for tests requiring pulse modulation of the second source, such as simulating the transmission and processing of pulse signals in devices, often used in radar and communication fields for testing pulse response devices.
    N5245A - 025 Added four internal pulse generators For scenarios requiring multiple pulse signals for excitation or testing, such as testing the timing characteristics of digital circuits and pulse-driven sensors, four internal pulse generators can provide pulse signals with different parameters.
    N5245A - 460 Integrated true-mode stimulus application Used in specific application scenarios requiring true differential stimulus, such as precise testing of differential amplifiers and balanced mixers, providing stimulus signals that meet differential characteristics.
    N5245A - 008 Pulse - RF Measurement Used in scenarios for measuring and analyzing RF pulse signals, such as RF pulse transmission and reception testing in radar systems and pulse modulation signal testing in communication systems.
    N5245A - 010 Time Domain Measurement Suitable for analyzing the characteristics of signals in the time domain, such as measuring parameters like rise time, fall time, and pulse width. Very useful for time-domain analysis of high-speed digital signals and pulse signals.
    N5245A - 028 Noise Figure Measurement using Standard Receiver Specifically used for measuring the noise figure of devices or systems. Used in RF circuit design and communication systems when evaluating noise performance.
    N5245A - 029 Fully corrected noise figure measurement to 26.5 GHz Used in scenarios requiring high-precision measurement of noise figure with a frequency range up to 26.5 GHz, often used for testing devices or systems in the millimeter-wave band.
    N5245A - 080 Frequency Offset Measurement Used to measure the frequency offset characteristics of signals. Used in communication systems for testing frequency-modulated signals and phase-locked loops.
    N5245A - 086 Gain Compression Application Mainly used to evaluate the gain compression characteristics of active devices such as amplifiers under different input powers. It is an important parameter in the design and testing of RF power amplifiers.
    N5245A - 087 Intermodulation Distortion Measurement Used to measure intermodulation distortion generated by nonlinear devices. In multi-carrier communication systems and RF power amplifiers, it is used to evaluate linearity indicators.
    N5245A - 118 Fast CW Mode Used in scenarios requiring fast continuous wave measurements to improve testing efficiency. Suitable for quickly scanning and measuring a large number of continuous wave signals.
    N5245A - 1A7 ISO 17025 compliant calibration Used to meet the calibration requirements of the ISO 17025 standard, ensuring that the instrument's calibration process and results meet internationally recognized standards. Suitable for laboratory environments requiring high-precision calibration and traceability.
    N5245A - 301 Application used with standard calibration kits When using standard calibration kits to calibrate the instrument, this option can better achieve the calibration function, ensuring the accuracy and reliability of the measurement.
    N5245A - 302 Applications used with the temperature characteristic calibration kit Use this option when the effect of temperature on measurement needs to be considered and calibration is performed using the temperature characteristic calibration kit. Accurate calibration under different temperature conditions can be achieved.

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