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N5249B PNA-X Microwave Network Analyzer, 900 Hz/10 MHz to 8.5 GHz
Category:
Network analyzer
Desktop network analyzer
Product Attachment:
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- Brand: 是德科技
- Commodity name: N5249B PNA-X Microwave Network Analyzer, 900 Hz/10 MHz to 8.5 GHz
- Brand: Keysight Technologies
N5249B Vector Network Analyzer (Keysight PNA Series)
The N5249B is a 10 MHz to 8.5 GHz wideband vector network analyzer in the Keysight PNA series. It is designed for RF microwave device R&D, 5G communication component testing, and industrial automation lines. It covers the V-band (40-75 GHz), E-band (60-90 GHz), and W-band (75-110 GHz) (requires optional extension), suitable for satellite communication payloads, automotive radar (76-81 GHz), 5G millimeter wave (such as the n261 band), and high-frequency interconnect testing of advanced packaging (SiP/PCB). Its core advantages include a 127 dB system dynamic range, sub-millimeter time-domain resolution, and multi-port full-polarization measurement capabilities, meeting the complex needs from research-level precision characterization to production line automated testing.
Key Technical Specifications
Frequency Coverage:
Basic Range: 10 MHz to 8.5 GHz, supports low-frequency extension to 900 Hz (requires option), covering the full frequency range from audio to high-frequency microwaves, suitable for automotive radar (76-81 GHz requires optional extension), satellite communication (such as Ka/Ku band), and other high-frequency applications.
Supports frequency extension modules (such as the S930707B option, expandable to 67 GHz), compatible with future technological advancements (such as pre-research of devices above 100 GHz).
Measurement Accuracy and Dynamic Performance:
System Dynamic Range: 127 dB (typical value, 2 ports), receiver noise floor as low as -110 dBm, supports precise measurement of weak signals from low-noise amplifiers (LNAs) and low-loss filters, reducing the impact of noise on small signal parameters (such as S21 insertion loss).
Trace Noise: Amplitude noise 0.002 dB rms, phase noise 0.1° rms, ensuring S-parameter repeatability, suitable for consistent screening of precision devices (such as dielectric filters, circulators).
Power and Linearity:
Maximum output power +13 dBm (typical value), power scan range 35 dB, supports power-dependent testing of active devices (such as P1dB compression point, IMD3 intermodulation distortion), harmonic suppression better than -60 dBc (up to the 2nd harmonic).
Supports pulse signal testing (requires option), minimum pulse width 100 ns, suitable for transient power characteristic analysis of radar pulse components.
Speed and Flexibility:
201-point scan time as fast as 6 ms (fast scan mode), intermediate frequency bandwidth (IFBW) supports 10 Hz to 10 MHz, balancing noise sensitivity and mass production testing efficiency.
Standard 2-port single source, upgradeable to 4-port dual-source configuration, supports full 4-port 12-item error correction, compatible with multi-port networks (such as duplexers, multi-antenna arrays) for amplitude and phase consistency calibration.
Calibration and Interface:
Built-in electronic calibration unit (ECal) interface, completes fully automatic calibration within 15 seconds, supports non-insertion calibration (such as on-chip device probe station testing); standard bias-tee, simplifies active device bias power supply.
Functional Characteristics
Full Parameter and Advanced Analysis Capabilities:
Basic Measurements: 4-port S-parameters (amplitude/phase, real/imaginary), impedance/admittance, VSWR, group delay, stability factor, supports real-time display and storage of complex data formats.
Advanced Functions:
Nonlinear Characterization: Integrated harmonic balance algorithm, supports 3rd/5th harmonic power measurement, AM/AM and AM/PM conversion analysis, suitable for power amplifier linearization design and pre-distortion algorithm optimization.
Differential Mode: Supports common-mode/differential-mode parameter testing of balanced devices (such as differential antennas, high-speed interconnects), meeting the signal integrity analysis requirements of PCIe 5.0, SerDes, and other high-speed interfaces (requires option).
Integrated Noise Figure Measurement: Built-in noise source interface, directly measures device noise figure (NF) and associated gain (Gass), eliminating the need for external independent instruments, simplifying multi-instrument collaborative testing processes.
Time-Domain and Material Analysis Tools:
Time-Domain Fault Location: Achieves an electrical length resolution of 0.5 mm (at 8.5 GHz) through inverse Fourier transform (IFT), locating cable/connector discontinuities and PCB trace defects, supporting pulse response filtering and gating functions.
Material Dielectric Property Measurement: In conjunction with coaxial probes (such as 1.85 mm interface), waveguide fixtures, or free-space testing devices, combined with PLTS software to fit dielectric constant (εr) and loss tangent (tanδ), supporting high-frequency board materials (such as Rogers, LTCC) and new materials (metamaterials, graphene) electromagnetic characteristic characterization.
Intelligent Operation and System Integration:
Human-Machine Interaction: 12.1-inch touch screen, supports multi-window display (Smith chart, polar coordinates, time-domain waveform), gesture zoom/drag operation, data can be exported to CSV, PDF, or images (including metadata) with one click.
Expansion Capabilities: Equipped with USB 3.0, LAN (LXI), GPIB, and trigger interfaces, compatible with LabVIEW, MATLAB, and Keysight PathWave Test Automation software, supporting multi-instrument synchronization (such as with signal sources and spectrum analyzers), facilitating the construction of fully automated testing systems.
Typical Application Scenarios
Satellite Communication and Payload Testing:
Verify the gain flatness and port isolation of Ka/Ku band (26.5-40 GHz) and W-band (75-110 GHz) devices (such as low-noise amplifiers and power dividers), ensuring high-reliability transmission of satellite-to-ground links (requires optional extension).
Test the phase consistency of satellite antenna feed networks, support amplitude and phase calibration of multi-beam antenna arrays, meet the phase accuracy requirements of high-resolution imaging radar.
Automotive Radar and Intelligent Driving:
Analyze the standing wave ratio and intermodulation distortion of the 76-81 GHz radar front-end module (such as MMIC chips and microstrip antennas) to ensure the anti-interference capability and target detection accuracy of the radar sensor (requires optional expansion).
Evaluate the harmonic suppression and spurious signals of the radar transmitter to meet the reliability requirements of RF components in the ISO 26262 functional safety standard.
5G Millimeter Wave and Advanced Packaging:
Test the in-band insertion loss and out-of-band suppression of 5G NR high-frequency bands (such as the n261 band, 24.25-52.6 GHz) filters, supporting phase consistency calibration of large-scale MIMO antenna arrays (requires optional expansion).
Characterize the insertion loss and return loss of high-frequency interconnect structures (such as vias and bond wires) in advanced packaging (SiP, Flip Chip), combine time-domain analysis to locate interconnect defects, and optimize packaging electromagnetic compatibility.
Scientific Research and Precision Measurement:
Universities/Laboratories: Used for high-frequency microwave circuit design (such as finline filters, dielectric resonators), electromagnetic characteristic characterization of new materials (such as metamaterials, graphene devices), supporting custom algorithm development and firmware upgrades.
Industrial Production Line: High-speed scanning mode adapts to high-frequency connectors (such as 1.0 mm, 1.85 mm connectors), and batch screening of chip devices. Built-in statistical functions monitor the yield in real time and generate compliant test reports (such as those compliant with CE, FCC standards).
Summary of Advantages
The N5249B, with its core advantages of 10 MHz - 8.5 GHz base frequency coverage, 127 dB high dynamic range, and sub-millimeter time-domain resolution, combines precision characterization of high-frequency microwave devices with mass production testing efficiency. Its intelligent calibration, flexible multi-port configuration, and powerful system integration capabilities effectively reduce the difficulty of testing in high-frequency complex scenarios, making it an ideal tool for satellite payload development, automotive radar verification, 5G millimeter-wave device production, and high-frequency material analysis. Through frequency extension options (such as S930707B), it can be further extended to 67 GHz to meet a wider range of high-frequency testing needs. -
P/N N5249B-201 2-port, configurable test set P/N N5249B-217 2-port, configurable test set, source attenuator, receiver attenuator P/N N5249B-219 2-port, configurable test set, source attenuator, receiver attenuator, bias tee P/N N5249B-222 2-port, configurable test set, source attenuator, receiver attenuator, 2nd source, combiner, mechanical switches P/N N5249B-224 2-port, configurable test set, source attenuator, receiver attenuator, bias tee, 2nd source, combiner, mechanical switches P/N N5249B-401 4-port, configurable test set, with 2nd source P/N N5249B-417 4-port, configurable test set, 2nd source, source attenuator, receiver attenuator P/N N5249B-419 4-port, configurable test set, 2nd source, source attenuator, receiver attenuator, bias tee P/N N5249B-422 4-port, configurable test set, 2nd source, source attenuator, receiver attenuator, combiner, mechanical switches P/N N5249B-423 4-port, configurable test set, 2nd source, source attenuator, receiver attenuator, bias tee, combiner, mechanical switches P/N N5249B-425 4-port, configurable test set, 2nd source, attenuator, combiner, mechanical switches, bias tee, low frequency extension Calibration Documentation
P/N N5249B-1A7 Calibration + Uncertainty + Guardbanding (Non-accredited) P/N N5249B-A6J ANSI Z540-1-1994 Calibration P/N N5249B-UK6 Commercial calibration certificate with test data Other Hardware Features
P/N N5249B-020 Add IF Inputs P/N N5249B-021 Add pulse modulator to internal 1st source P/N N5249B-022 Add pulse modulator to internal 2nd source P/N N5249B-029 Add noise receiver to 8.5 GHz N5249B-UNY Enhanced low phase noise performance P/N N5249B-XSB 3rd RF source up to 8.5 GHz Software with Subscription
S93007B Automatic Fixture Removal S93010B Time Domain Analysis S93011B Enhanced Time Domain Analysis with TDR S93015B Real-time S-parameter and power measurement uncertainty S93025B Basic Pulsed-RF Measurements S93026B Advanced Pulsed-RF Measurements S93027B Mechanical Noise Tuner Control S93029B Noise Figure Measurements with Vector Correction S930700B Modulation Distortion up to 8.5 GHz S930701B Modulation Distortion up to 13.5 GHz S930702B Modulation Distortion up to 26.5 GHz S930704B Modulation Distortion up to 43.5 GHz S930705B Modulation Distortion up to 50 GHz S930707B Modulation Distortion up to 70 GHz S93080B Frequency Offset Measurements S93082B Scalar Mixer/Converter Measurements S93083B Vector and Scalar Mixer/Converter Measurements S93084B Embedded-LO Functionality S93086B Gain Compression Measurements S93087B Intermodulation Distortion Measurements S93088B Source Phase Control S93089B Differential and I/Q Device Measurements S930900B Spectrum Analysis up to 8.5 GHz S93110B Active Hot Parameters S93118B Fast CW Measurements S93460B True-mode Stimulus S93551B N-port Measurements S93898B Built-in Performance Test Software S94510B Nonlinear Component Characterization S94511B Nonlinear Component Characterization, limited to 50 GHz S94514B Nonlinear X-Parameters S94518B Nonlinear Pulse Envelope Domain S94520B Arbitrary Load Impedance, X-Parameters S94521B Arbitrary Load Control, X-Parameters S94522B Arbitrary Load Control, Device Characteristics S930317B Phase noise measurement up to 70 GHz S930321B Phase noise measurement up to 125 GHz S93072B Internal 6 GHz arbitrary waveform generation S94601B Device Measurement eXpert - DMX S93051B IQ data bandwidth up to 4 GHz S94602B Limit Assistant Auxiliary Materials
Part Number N5249B-1CM Rack mount kit for handleless installation Part Number N5249B-1CP Rack mount kit for installation with handle Part Number N1966A Pulse/IO Adapter Part Number N6171A MATLAB Software N5249B-Solid State Drive Additional removable solid-state drive U8485A USB Power Sensor; 10MHz-33GHz; -33dBm to +20dBm
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Contact Information
Add.: 2nd Floor, Building C, Zhongzhi Zhichuang Park, Yucui Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province, China
Tel: +86-135 1042 6680
Email: harriosn@sengt.com
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